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name:-0.0052549839019775
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Yang; Xingwei Patent Filings

Yang; Xingwei

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yang; Xingwei.The latest application filed is for "system for defect indication detection".

Company Profile
3.4.5
  • Yang; Xingwei - Schenectady NY
  • Yang; Xingwei - Bellevue WA
  • Yang; Xingwei - Clifton Park NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
System for defect indication detection
Grant 10,481,108 - Ferro , et al. Nov
2019-11-19
System For Defect Indication Detection
App 20190137421 - FERRO; Andrew Frank ;   et al.
2019-05-09
Method for defect indication detection
Grant 10,203,290 - Ferro , et al. Feb
2019-02-12
Method For Defect Indication Detection
App 20160305895 - FERRO; Andrew Frank ;   et al.
2016-10-20
System and method for image based inspection of an object
Grant 9,305,345 - Lim , et al. April 5, 2
2016-04-05
Methods and systems for enhanced automated visual inspection of a physical asset
Grant 9,251,582 - Lim , et al. February 2, 2
2016-02-02
Method And System For Monitoring Operating Conditions In A Steam Generator
App 20150330866 - YANG; Xingwei ;   et al.
2015-11-19
System And Method For Image Based Inspection Of An Object
App 20150310604 - Lim; Ser Nam ;   et al.
2015-10-29
Methods and Systems for Enhanced Automated Visual Inspection of a Physical Asset
App 20140185912 - Lim; Ser Nam ;   et al.
2014-07-03

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