Patent | Date |
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Dual-die Semiconductor Package App 20220189927 - YANG; WU-DER ;   et al. | 2022-06-16 |
Method For Manufacturing Semiconductor Die With Decoupling Capacitor App 20220189959 - YANG; WU-DER | 2022-06-16 |
Semiconductor package Grant 11,348,893 - Yang May 31, 2 | 2022-05-31 |
Memory package structure Grant 11,322,467 - Yang May 3, 2 | 2022-05-03 |
Electronic system, die assembly and device die Grant 11,309,288 - Yang April 19, 2 | 2022-04-19 |
Method Of Testing With Ground Noise App 20220101935 - Yang; Wu-Der | 2022-03-31 |
Functional Test Equipment Including Relay System And Test Method Using The Functional Test Equipment App 20220099732 - YANG; WU-DER | 2022-03-31 |
Semiconductor Die With Decoupling Capacitor And Manufacturing Method Thereof App 20220093602 - YANG; WU-DER | 2022-03-24 |
Method For Preparing Semiconductor Package Having Multiple Voltage Supply Sources App 20220059507 - YANG; WU-DER | 2022-02-24 |
Ground bounce generator in device under test, automatic test equipment, and method of testing with ground noise Grant 11,250,925 - Yang February 15, 2 | 2022-02-15 |
Semiconductor package and method of fabricating the same Grant 11,239,220 - Yang February 1, 2 | 2022-02-01 |
Ground Bounce Generator In Device Under Test, Automatic Test Equipment, And Method Of Testing With Ground Noise App 20220028473 - YANG; Wu-Der | 2022-01-27 |
Electronic Module App 20220020737 - YANG; Wu-Der | 2022-01-20 |
Three-dimensional semiconductor package with partially overlapping chips and manufacturing method thereof Grant 11,227,814 - Yang , et al. January 18, 2 | 2022-01-18 |
Semiconductor structure Grant 11,222,839 - Yang January 11, 2 | 2022-01-11 |
Semiconductor package having multiple voltage supply sources and manufacturing method thereof Grant 11,222,871 - Yang January 11, 2 | 2022-01-11 |
Semiconductor Package And Method Of Fabricating The Same App 20210407972 - YANG; WU-DER | 2021-12-30 |
Memory Package Structure App 20210391288 - YANG; Wu-Der | 2021-12-16 |
Semiconductor Package Device App 20210391245 - YANG; Wu-Der | 2021-12-16 |
Semiconductor Package App 20210358878 - YANG; Wu-Der | 2021-11-18 |
Semiconductor Package Having Multiple Voltage Supply Sources And Manufacturing Method Thereof App 20210351162 - YANG; Wu-Der | 2021-11-11 |
Semiconductor structure and manufacturing method thereof Grant 11,158,586 - Hsieh , et al. October 26, 2 | 2021-10-26 |
Semiconductor Package App 20210320085 - YANG; Wu-Der | 2021-10-14 |
Electronic System, Die Assembly And Device Die App 20210320084 - YANG; WU-DER | 2021-10-14 |
Dual-die Semiconductor Package And Manufacturing Method Thereof App 20210305210 - YANG; WU-DER ;   et al. | 2021-09-30 |
Three-dimensional Semiconductor Package With Partially Overlapping Chips And Manufacturing Method Thereof App 20210287967 - YANG; Wu-Der ;   et al. | 2021-09-16 |
Semiconductor package including interconnection member and bonding wires and manufacturing method thereof Grant 11,121,103 - Yang September 14, 2 | 2021-09-14 |
Semiconductor Package Including Interconnection Member And Bonding Wires And Manufacturing Method Thereof App 20210280539 - YANG; Wu-Der | 2021-09-09 |
Printed circuit board structure having pads and conductive wire Grant 11,069,646 - Yang July 20, 2 | 2021-07-20 |
Semiconductor device Grant 11,049,848 - Yang June 29, 2 | 2021-06-29 |
Redistribution Layer Structure And Semiconductor Package App 20210143091 - Yang; Wu-Der | 2021-05-13 |
Redistribution layer structure and semiconductor package Grant 10,991,648 - Yang April 27, 2 | 2021-04-27 |
Chip-package Device App 20210118838 - YANG; Wu-Der ;   et al. | 2021-04-22 |
Semiconductor Package And Manufacturing Method Thereof App 20210111145 - YANG; Wu-Der | 2021-04-15 |
Semiconductor package and manufacturing method thereof Grant 10,978,419 - Yang April 13, 2 | 2021-04-13 |
Printed Circuit Board Structure Having Pads And Conductive Wire App 20210098413 - YANG; Wu-Der | 2021-04-01 |
Semiconductor package and manufacturing method thereof Grant 10,937,754 - Yang March 2, 2 | 2021-03-02 |
Semiconductor package and manufacturing method thereof Grant 10,903,144 - Yang January 26, 2 | 2021-01-26 |
Semiconductor Structure And Manufacturing Method Thereof App 20200211979 - HSIEH; Chang-Chun ;   et al. | 2020-07-02 |
Housing assembly and memory device Grant 10,062,620 - Hsu , et al. August 28, 2 | 2018-08-28 |
Stacked-type chip package structure and fabrication method thereof Grant 8,338,929 - Chen , et al. December 25, 2 | 2012-12-25 |
Multi-chip stack package Grant 8,022,523 - Chen , et al. September 20, 2 | 2011-09-20 |
Multi-chip Stack Package App 20090250822 - Chen; Jen-Chun ;   et al. | 2009-10-08 |
Stacked-type Chip Package Structure And Fabrication Method Thereof App 20090146283 - Chen; Jen-Chun ;   et al. | 2009-06-11 |
Fuse structure window Grant 7,538,410 - Yang May 26, 2 | 2009-05-26 |
Package Device App 20080135999 - Yang; Wu-Der | 2008-06-12 |
Fuse structure window App 20070023861 - Yang; Wu-Der | 2007-02-01 |
Chip scale package socket for various package sizes Grant 7,001,185 - Yang February 21, 2 | 2006-02-21 |
Fuse structure window Grant 6,858,913 - Yang February 22, 2 | 2005-02-22 |
Double capacity stacked memory and fabrication method thereof Grant 6,826,067 - Yang November 30, 2 | 2004-11-30 |
Fuse structure window App 20040140524 - Yang, Wu-Der | 2004-07-22 |
Fuse structure window Grant 6,750,753 - Yang June 15, 2 | 2004-06-15 |
Method of quickly determining work line failure type Grant 6,707,732 - Yang March 16, 2 | 2004-03-16 |
Double capacity stacked memory and fabrication method thereof App 20040041259 - Yang, Wu-Der | 2004-03-04 |
Fuse and fuse window structure Grant 6,686,645 - Yang February 3, 2 | 2004-02-03 |
Fuse And Fuse Window Structure App 20040016990 - Yang, Wu-Der | 2004-01-29 |
Chip scale package socket App 20040017666 - Yang, Wu-Der | 2004-01-29 |
Fuse structure window App 20040012476 - Yang, Wu-Der | 2004-01-22 |
Fuse structure window App 20040012072 - Yang, Wu-Der | 2004-01-22 |
Fuse structure Grant 6,667,535 - Yang December 23, 2 | 2003-12-23 |
Fuse structure Grant 6,639,297 - Yang October 28, 2 | 2003-10-28 |
Method of quickly determining work line failure type App 20030185063 - Yang, Wu-Der | 2003-10-02 |
Fuse Structure App 20030132503 - Yang, Wu-Der | 2003-07-17 |
Fuse structure App 20030122217 - Yang, Wu-Der | 2003-07-03 |
Method for quickly identifying floating cells by a bit-line coupling pattern (BLCP) Grant 6,115,834 - Jen , et al. September 5, 2 | 2000-09-05 |