loadpatents
name:-0.023064851760864
name:-0.0069460868835449
name:-0.0036280155181885
YANG; Shenzhi Patent Filings

YANG; Shenzhi

Patent Applications and Registrations

Patent applications and USPTO patent grants for YANG; Shenzhi.The latest application filed is for "addressable test chip".

Company Profile
1.7.8
  • YANG; Shenzhi - Hangzhou CN
  • Yang; Shenzhi - Yorktown Heights NY
  • Yang; Shenzhi - US
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Addressable Test Chip
App 20220146573 - LAN; Fan ;   et al.
2022-05-12
Addressable test system with address register
Grant 11,243,251 - Lan , et al. February 8, 2
2022-02-08
Addressable Test System With Address Register
App 20200355742 - LAN; Fan ;   et al.
2020-11-12
Addressable test chip test system
Grant 10,254,339 - Lan , et al.
2019-04-09
Addressable Test Chip Test System
App 20180188324 - LAN; Fan ;   et al.
2018-07-05
Via chains for defect localization
Grant 9,564,379 - Bahierathan , et al. February 7, 2
2017-02-07
Static random access memory test structure
Grant 8,787,074 - Patterson , et al. July 22, 2
2014-07-22
Via Chains For Defect Localization
App 20130299828 - Bahierathan; Balasingham ;   et al.
2013-11-14
Via chains for defect localization
Grant 8,546,155 - D'Aleo , et al. October 1, 2
2013-10-01
Static Random Access Memory Test Structure
App 20130094315 - Patterson; Oliver D. ;   et al.
2013-04-18
Via Chains For Defect Localization
App 20130082257 - Balasingham; Bahierathan ;   et al.
2013-04-04

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