Yanaka; Yu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yanaka; Yu.The latest application filed is for "optical surface defect inspection apparatus and optical surface defect inspection method".

Company Profile

0.5.11

Yanaka; Yu - Kamisato-machi JP
Yanaka; Yu - Kamisato JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for inspecting surface of a disk Grant 8,873,031 - Yanaka , et al. October 28, 2	2014-10-28
Optical Surface Defect Inspection Apparatus And Optical Surface Defect Inspection Method App 20140071442 - SERIKAWA; Shigeru ; et al.	2014-03-13
Surface Inspecting Apparatus Having Double Recipe Processing Function App 20140043603 - YANAKA; Yu ; et al.	2014-02-13
Method and apparatus for inspecting patterned media disk Grant 8,605,278 - Suzuki , et al. December 10, 2	2013-12-10
Method And Apparatus For Inspecting Surface Of A Disk App 20130258326 - HORIE; Kiyotaka ; et al.	2013-10-03
Disk Surface Inspection Method And Disk Surface Inspection Device App 20130258328 - SUGIMOTO; Nobuyuki ; et al.	2013-10-03
Method And Apparatus For Inspecting Surface Of A Magnetic Disk App 20130258320 - FUNAKI; Toshiharu ; et al.	2013-10-03
Method and apparatus for inspecting a surface of a substrate Grant 8,547,545 - Sasazawa , et al. October 1, 2	2013-10-01
Substrate Surface Defect Inspection Method And Inspection Device App 20130077092 - SASAZAWA; Hideaki ; et al.	2013-03-28
Inspection Method And Device For Same App 20120320367 - Yanaka; Yu ; et al.	2012-12-20
Method And Apparatus For Inspecting Patterned Media Disk App 20120154798 - SUZUKI; Ryuta ; et al.	2012-06-21
Method And Apparatus For Inspecting A Surface Of A Substrate App 20120081701 - SASAZAWA; Hideaki ; et al.	2012-04-05
Disk Surface Defect Inspection Method And Apparatus App 20100246356 - FARIZ; Bin Abdulrashid ; et al.	2010-09-30

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