Yanagisawa; Masayuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yanagisawa; Masayuki.The latest application filed is for "probe resistance measurement method and semiconductor device with pads for probe resistance measurement".

Company Profile

0.8.5

Yanagisawa; Masayuki - Kanagawa JP
Yanagisawa; Masayuki - Kawasaki JP
Yanagisawa; Masayuki - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Probe resistance measurement method and semiconductor device with pads for probe resistance measurement Grant 9,217,770 - Michimata , et al. December 22, 2	2015-12-22
Probe Resistance Measurement Method And Semiconductor Device With Pads For Probe Resistance Measurement App 20130001551 - MICHIMATA; Shigetomi ; et al.	2013-01-03
Probe resistance measurement method and semiconductor device with pads for probe resistance measurement Grant 8,278,935 - Michimata , et al. October 2, 2	2012-10-02
Semiconductor Integrated Circuit Device App 20110079834 - YANAGISAWA; Masayuki ; et al.	2011-04-07
Method of manufacturing semiconductor device Grant 7,879,532 - Yanagisawa February 1, 2	2011-02-01
Probe resistance measurement method and semiconductor device with pads for probe resistance measurement App 20090008641 - Michimata; Shigetomi ; et al.	2009-01-08
Semiconductor device with fuse wires and connection wires Grant 7,361,967 - Takahashi , et al. April 22, 2	2008-04-22
Method of manufacturing semiconductor device App 20070009836 - Yanagisawa; Masayuki	2007-01-11
Semiconductor device App 20050181680 - Takahashi, Hiroyuki ; et al.	2005-08-18
Process of manufacturing semiconductor devices Grant 5,262,258 - Yanagisawa November 16, 1	1993-11-16
Semiconductor device Grant 5,187,550 - Yanagisawa February 16, 1	1993-02-16
Method of manufacturing integrated circuit semiconductor device Grant 4,806,457 - Yanagisawa February 21, 1	1989-02-21

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