loadpatents
Patent applications and USPTO patent grants for Yanagimoto; Hiroaki.The latest application filed is for "wheel loader".
Patent | Date |
---|---|
Wheel loader Grant 9,151,017 - Kaneko , et al. October 6, 2 | 2015-10-06 |
Hybrid work vehicle Grant 9,038,759 - Kaneko , et al. May 26, 2 | 2015-05-26 |
Hybrid wheel loader Grant 8,914,177 - Kaneko , et al. December 16, 2 | 2014-12-16 |
Wheel Loader App 20130317684 - Kaneko; Satoru ;   et al. | 2013-11-28 |
Hybrid Wheel Loader App 20130151055 - Kaneko; Satoru ;   et al. | 2013-06-13 |
Hybrid Work Vehicle App 20130149093 - Kaneko; Satoru ;   et al. | 2013-06-13 |
Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe Microscope App 20080236259 - Kurenuma; Tooru ;   et al. | 2008-10-02 |
Probe manufacturing method, probe, and scanning probe microscope Grant 7,388,199 - Morimoto , et al. June 17, 2 | 2008-06-17 |
Probe Control Method For Scanning Probe Microscope App 20080087820 - KURENUMA; Toru ;   et al. | 2008-04-17 |
Scanning type probe microscope and probe moving control method therefor Grant 7,350,404 - Kurenuma , et al. April 1, 2 | 2008-04-01 |
Scanning probe microscope and measurement method using the same Grant 7,333,191 - Murayama , et al. February 19, 2 | 2008-02-19 |
Probe replacement method for scanning probe microscope App 20070180889 - Murayama; Ken ;   et al. | 2007-08-09 |
Scanning type probe microscope and probe moving control method therefor App 20060284083 - Kurenuma; Tooru ;   et al. | 2006-12-21 |
Probe manufacturing method, probe, and scanning probe microsope App 20060284084 - Morimoto; Takafumi ;   et al. | 2006-12-21 |
Scanning probe microscope and measurement method using the same App 20050012936 - Murayama, Ken ;   et al. | 2005-01-20 |
Ultrasonic inspection and imaging instrument Grant 5,179,954 - Arima , et al. January 19, 1 | 1993-01-19 |
Ultrasonic flaw detector Grant D328,714 - Nakajima , et al. August 18, 1 | 1992-08-18 |
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