loadpatents
name:-0.0087590217590332
name:-0.0072309970855713
name:-0.00045204162597656
Yanagimoto; Hiroaki Patent Filings

Yanagimoto; Hiroaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yanagimoto; Hiroaki.The latest application filed is for "wheel loader".

Company Profile
0.11.12
  • Yanagimoto; Hiroaki - Kasumigaura N/A JP
  • Yanagimoto; Hiroaki - Kasumigaura-shi JP
  • Yanagimoto; Hiroaki - Ibaraki JP
  • Yanagimoto; Hiroaki - Tsuchiura JP
  • Yanagimoto; Hiroaki - Tsuchiura-Shi JP
  • Yanagimoto, Hiroaki - Niihari-Gun JP
  • Yanagimoto; Hiroaki - Ohaza Niihari Chiyoda-mura JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Wheel loader
Grant 9,151,017 - Kaneko , et al. October 6, 2
2015-10-06
Hybrid work vehicle
Grant 9,038,759 - Kaneko , et al. May 26, 2
2015-05-26
Hybrid wheel loader
Grant 8,914,177 - Kaneko , et al. December 16, 2
2014-12-16
Wheel Loader
App 20130317684 - Kaneko; Satoru ;   et al.
2013-11-28
Hybrid Wheel Loader
App 20130151055 - Kaneko; Satoru ;   et al.
2013-06-13
Hybrid Work Vehicle
App 20130149093 - Kaneko; Satoru ;   et al.
2013-06-13
Method of Control of Probe Scan and Apparatus for Controlling Probe Scan of Scanning Probe Microscope
App 20080236259 - Kurenuma; Tooru ;   et al.
2008-10-02
Probe manufacturing method, probe, and scanning probe microscope
Grant 7,388,199 - Morimoto , et al. June 17, 2
2008-06-17
Probe Control Method For Scanning Probe Microscope
App 20080087820 - KURENUMA; Toru ;   et al.
2008-04-17
Scanning type probe microscope and probe moving control method therefor
Grant 7,350,404 - Kurenuma , et al. April 1, 2
2008-04-01
Scanning probe microscope and measurement method using the same
Grant 7,333,191 - Murayama , et al. February 19, 2
2008-02-19
Probe replacement method for scanning probe microscope
App 20070180889 - Murayama; Ken ;   et al.
2007-08-09
Scanning type probe microscope and probe moving control method therefor
App 20060284083 - Kurenuma; Tooru ;   et al.
2006-12-21
Probe manufacturing method, probe, and scanning probe microsope
App 20060284084 - Morimoto; Takafumi ;   et al.
2006-12-21
Scanning probe microscope and measurement method using the same
App 20050012936 - Murayama, Ken ;   et al.
2005-01-20
Ultrasonic inspection and imaging instrument
Grant 5,179,954 - Arima , et al. January 19, 1
1993-01-19
Ultrasonic flaw detector
Grant D328,714 - Nakajima , et al. August 18, 1
1992-08-18

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