Yamazaki; Kazuya
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yamazaki; Kazuya.The latest application filed is for "charged particle beam apparatus and adjustment method for charged particle beam apparatus".
- Yamazaki; Kazuya - Tokyo JP
- Yamazaki; Kazuya - Joso N/A JP
- Yamazaki; Kazuya - Toride JP
- Yamazaki; Kazuya - Joso-shi JP
- Yamazaki; Kazuya - Toride-shi JP
- Yamazaki, Kazuya - Kyoto-shi JP
- Yamazaki, Kazuya - Kyoto JP
- YAMAZAKI, KAZUYA - YUUKI-GUN JP
- Yamazaki; Kazuya - Ibaraki-ken JP
| Patent | Date |
|---|---|
| Charged particle beam apparatus and adjustment method for charged particle beam apparatus Grant 11,309,161 - Yamazaki April 19, 2 | 2022-04-19 |
| Charged particle beam device and control method of optical system of charged particle beam device Grant 11,222,764 - Yamazaki , et al. January 11, 2 | 2022-01-11 |
| Charged Particle Beam Apparatus and Adjustment Method for Charged Particle Beam Apparatus App 20210233739 - Yamazaki; Kazuya | 2021-07-29 |
| Charged Particle Beam Device and Control Method of Optical System of Charged Particle Beam Device App 20200343072 - Yamazaki; Kazuya ; et al. | 2020-10-29 |
| Charged particle system and method for measuring deflection fields in a sample Grant 10,332,720 - Yamazaki | 2019-06-25 |
| Beam alignment method and electron microscope Grant 10,020,162 - Shimizu , et al. July 10, 2 | 2018-07-10 |
| Beam Alignment Method and Electron Microscope App 20170301507 - Shimizu; Yuko ; et al. | 2017-10-19 |
| Electron microscope Grant 9,773,639 - Yamazaki September 26, 2 | 2017-09-26 |
| Charged Particle System and Measuring Method App 20170133196 - Yamazaki; Kazuya | 2017-05-11 |
| Transmission electron microscope Grant 9,595,416 - Yamazaki March 14, 2 | 2017-03-14 |
| Electron Microscope App 20170025244 - Yamazaki; Kazuya | 2017-01-26 |
| Transmission Electron Microscope App 20150311029 - Yamazaki; Kazuya | 2015-10-29 |
| Transmission electron microscope and method of observing TEM images Grant 8,772,714 - Yamazaki July 8, 2 | 2014-07-08 |
| Cutting insert Grant 8,657,540 - Yamazaki , et al. February 25, 2 | 2014-02-25 |
| Method of evacuating sample holder, pumping system, and electron microscope Grant 8,604,445 - Yamazaki December 10, 2 | 2013-12-10 |
| Cutting insert Grant 8,585,330 - Yamazaki , et al. November 19, 2 | 2013-11-19 |
| Transmission Electron Microscope and Method of Observing TEM Images App 20130299696 - Yamazaki; Kazuya | 2013-11-14 |
| Method of Evacuating Sample Holder, Pumping System, and Electron Microscope App 20130168549 - Yamazaki; Kazuya | 2013-07-04 |
| Cutting Insert App 20120275869 - Yamazaki; Kazuya ; et al. | 2012-11-01 |
| Cutting Insert App 20110142555 - Yamazaki; Kazuya ; et al. | 2011-06-16 |
| Cutting Insert App 20080219784 - Yamazaki; Kazuya ; et al. | 2008-09-11 |
| Duplicate thermal invoice slip App 20040059648 - Nanbu, Kazutaka ; et al. | 2004-03-25 |
| Invoice App 20040056475 - Nanbu, Kazutaka ; et al. | 2004-03-25 |
| Method for supporting shipment of virtual shopping mall App 20030182203 - Kumakawa, Takayasu ; et al. | 2003-09-25 |
| Interference Fit Type Cutting Tool App 20010041106 - NAGAYA, HIDEHIKO ; et al. | 2001-11-15 |
| Interference fit type cutting tool Grant 6,312,201 - Nagaya , et al. November 6, 2 | 2001-11-06 |
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