YAMASHITA; Kinya
Patent Applications and Registrations
Patent applications and USPTO patent grants for YAMASHITA; Kinya.The latest application filed is for "semiconductor test apparatus and semiconductor test method".
Company Profile
5.27.30
- YAMASHITA; Kinya - Tokyo JP
- Yamashita; Kinya - Shizuoka JP
- Yamashita; Kinya - Mishima JP
- Yamashita; Kinya - Mishima-shi JP
- Yamashita; Kinya - Osaka JP
Patent Activity
| Patent | Date |
|---|---|
| Semiconductor Test Apparatus And Semiconductor Test Method App 20220128616 - TAKAKI; Yasushi ; et al. | 2022-04-28 |
| Evaluation apparatus including a plurality of insulating portions surrounding a probe and semiconductor device evaluation method based thereon Grant 10,539,607 - Okada , et al. Ja | 2020-01-21 |
| Evaluation apparatus and evaluation method Grant 10,436,833 - Okada , et al. O | 2019-10-08 |
| Semiconductor Pick-up Apparatus App 20190109026 - YAMASHITA; Kinya ; et al. | 2019-04-11 |
| Semiconductor device and method for testing same Grant 10,228,412 - Akiyama , et al. | 2019-03-12 |
| Semiconductor device and electrical contact structure thereof Grant 10,192,797 - Akiyama , et al. Ja | 2019-01-29 |
| Evaluation Apparatus And Evaluation Method App 20180180660 - OKADA; Akira ; et al. | 2018-06-28 |
| Evaluation Apparatus And Semiconductor Device Evaluation Method App 20180088170 - OKADA; Akira ; et al. | 2018-03-29 |
| Semiconductor evaluation apparatus and semiconductor evaluation method Grant 9,720,014 - Okada , et al. August 1, 2 | 2017-08-01 |
| Semiconductor evaluation apparatus Grant 9,678,143 - Okada , et al. June 13, 2 | 2017-06-13 |
| Semiconductor device assessment apparatus Grant 9,551,745 - Akiyama , et al. January 24, 2 | 2017-01-24 |
| Contact-probe Type Temperature Detector, Semiconductor Device Evaluation Apparatus And Semiconductor Device Evaluating Method App 20160377486 - YAMASHITA; Kinya ; et al. | 2016-12-29 |
| Semiconductor Device App 20160343627 - AKIYAMA; Hajime ; et al. | 2016-11-24 |
| Semiconductor Device And Method For Testing Same App 20160334458 - AKIYAMA; Hajime ; et al. | 2016-11-17 |
| Semiconductor testing jig and semiconductor testing method performed by using the same Grant 9,347,988 - Akiyama , et al. May 24, 2 | 2016-05-24 |
| Semiconductor evaluating device and semiconductor evaluating method Grant 9,335,371 - Akiyama , et al. May 10, 2 | 2016-05-10 |
| Semiconductor Evaluation Apparatus And Semiconductor Evaluation Method App 20160116501 - OKADA; Akira ; et al. | 2016-04-28 |
| Wafer suction method, wafer suction stage, and wafer suction system Grant 9,312,160 - Akiyama , et al. April 12, 2 | 2016-04-12 |
| Semiconductor testing jig and transfer jig for the same Grant 9,257,316 - Okada , et al. February 9, 2 | 2016-02-09 |
| Inspection apparatus Grant 9,207,257 - Okada , et al. December 8, 2 | 2015-12-08 |
| Inspection apparatus Grant 9,188,624 - Okada , et al. November 17, 2 | 2015-11-17 |
| Method for manufacturing semiconductor device Grant 9,117,880 - Akiyama , et al. August 25, 2 | 2015-08-25 |
| Semiconductor Evaluation Apparatus App 20150115989 - OKADA; Akira ; et al. | 2015-04-30 |
| Semiconductor Testing Jig And Transfer Jig For The Same App 20150091599 - OKADA; Akira ; et al. | 2015-04-02 |
| Inspection apparatus and inspection method Grant 8,981,805 - Okada , et al. March 17, 2 | 2015-03-17 |
| Test apparatus and test method Grant 8,980,655 - Okada , et al. March 17, 2 | 2015-03-17 |
| Test Apparatus And Test Method App 20150044788 - OKADA; Akira ; et al. | 2015-02-12 |
| Semiconductor Device Assessment Apparatus App 20140347081 - AKIYAMA; Hajime ; et al. | 2014-11-27 |
| Method For Manufacturing Semiconductor Device App 20140342544 - AKIYAMA; Hajime ; et al. | 2014-11-20 |
| Semiconductor Evaluating Device And Semiconductor Evaluating Method App 20140210500 - AKIYAMA; Hajime ; et al. | 2014-07-31 |
| Inspection Apparatus App 20140015554 - OKADA; Akira ; et al. | 2014-01-16 |
| Semiconductor Testing Jig And Semiconductor Testing Method Performed By Using The Same App 20140009183 - AKIYAMA; Hajime ; et al. | 2014-01-09 |
| Inspection Apparatus And Inspection Method App 20130321015 - OKADA; Akira ; et al. | 2013-12-05 |
| Probe Card App 20130321019 - OKADA; Akira ; et al. | 2013-12-05 |
| Inspection Apparatus App 20130285684 - OKADA; Akira ; et al. | 2013-10-31 |
| Wafer Suction Method, Wafer Suction Stage, And Wafer Suction System App 20130256964 - AKIYAMA; Hajime ; et al. | 2013-10-03 |
| Branched polyalkylene glycols Grant 7,691,367 - Yamasaki , et al. April 6, 2 | 2010-04-06 |
| Branched polyalkylene glycols Grant 7,547,765 - Yamasaki , et al. June 16, 2 | 2009-06-16 |
| Branched Polyalkylene Glycols App 20080125350 - Yamasaki; Motoo ; et al. | 2008-05-29 |
| Branched polyalkylene glycols Grant 7,291,713 - Yamasaki , et al. November 6, 2 | 2007-11-06 |
| hG-CSF fusion polypeptide having c-mpl activity, DNA coding for same and methods of treating anemia using same Grant 6,884,419 - Yokoi , et al. April 26, 2 | 2005-04-26 |
| Branched polyalkylene glycols App 20050063936 - Yamasaki, Motoo ; et al. | 2005-03-24 |
| Rotary cooling roller Grant 6,675,876 - Yamashita , et al. January 13, 2 | 2004-01-13 |
| Branched polyalkylene glycols App 20030219404 - Yamasaki, Motoo ; et al. | 2003-11-27 |
| Rotary cooling roller App 20030029603 - Yamashita, Kinya ; et al. | 2003-02-13 |
| Alkyl and aralkyl-substituted pyrrolocarbazole derivatives that stimulate platelet production Grant 5,728,709 - Ikuina , et al. March 17, 1 | 1998-03-17 |
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