Yamanaka; Kazushi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yamanaka; Kazushi.The latest application filed is for "system, method and program for calibrating moisture sensor".

Company Profile

5.30.22

Yamanaka; Kazushi - Sendai JP
YAMANAKA; Kazushi - Sendai-shi JP
Yamanaka; Kazushi - Toyota JP
Yamanaka; Kazushi - Toyota-Shi JP
Yamanaka; Kazushi - Ichinomiya JP
YAMANAKA; Kazushi - Ichinomiya-shi JP
Yamanaka; Kazushi - Miyagi JP
Yamanaka; Kazushi - Tsukuba JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System, method and computer program product for measuring gas concentration Grant 11,333,631 - Yamanaka , et al. May 17, 2	2022-05-17
System, method and computer program product for gas analysis Grant 11,313,836 - Yamanaka , et al. April 26, 2	2022-04-26
Standard-moisture generator, system using the standard-moisture generator, method for detecting abnormality in standard-moisture and computer program product for detecting the abnormality Grant 11,307,176 - Tsukahara , et al. April 19, 2	2022-04-19
System, Method And Program For Calibrating Moisture Sensor App 20210372978 - IWAYA; Takamitsu ; et al.	2021-12-02
Standard-moisture Generator, System Using The Standard-moisture Generator, Method For Detecting Abnormality In Standard-moisture And Computer Program Product For Detecting The Abnormality App 20200400619 - TSUKAHARA; Yusuke ; et al.	2020-12-24
System, Method And Computer Program Product For Gas Analysis App 20200225190 - YAMANAKA; Kazushi ; et al.	2020-07-16
System, Method And Computer Program Product For Measuring Gas Concentration App 20190360966 - YAMANAKA; Kazushi ; et al.	2019-11-28
Electrical signal processing device Grant 10,436,757 - Yamanaka , et al. O	2019-10-08
Electrical Signal Processing Device App 20170307567 - YAMANAKA; Kazushi ; et al.	2017-10-26
Semiconductor chip and method for detecting disconnection of wire bonded to semiconductor chip Grant 9,726,709 - Kajiyama , et al. August 8, 2	2017-08-08
Semiconductor Chip And Method For Detecting Disconnection Of Wire Bonded To Semiconductor Chip App 20160231373 - Kajiyama; Taro ; et al.	2016-08-11
Imaging method of structure defect, imaging device of structure defect, imaging method of bubble or lesion and imaging device of bubble or lesion Grant 8,559,696 - Yamanaka , et al. October 15, 2	2013-10-15
Gas analyzer and method of gas analysis Grant 8,220,310 - Yamanaka , et al. July 17, 2	2012-07-17
Booster circuit Grant 8,106,703 - Nagai , et al. January 31, 2	2012-01-31
Nonvolatile semiconductor memory device Grant 8,004,902 - Amanai , et al. August 23, 2	2011-08-23
Imaging Method Of Structure Defect, Imaging Device Of Structure Defect, Imaging Method Of Bubble Or Lesion And Imaging Device Of Bubble Or Lesion App 20110123119 - Yamanaka; Kazushi ; et al.	2011-05-26
Booster Circuit App 20100301927 - NAGAI; Yoshihiro ; et al.	2010-12-02
Nonvolatile Semiconductor Memory Device App 20100124125 - AMANAI; Masakazu ; et al.	2010-05-20
Gas Analyzer And Method Of Gas Analysis App 20100018288 - Yamanaka; Kazushi ; et al.	2010-01-28
Environment difference detector Grant 7,647,814 - Nakaso , et al. January 19, 2	2010-01-19
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device Grant 7,423,360 - Nakaso , et al. September 9, 2	2008-09-09
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device Grant 7,408,285 - Nakaso , et al. August 5, 2	2008-08-05
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device Grant 7,368,848 - Nakaso , et al. May 6, 2	2008-05-06
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device Grant 7,368,847 - Nakaso , et al. May 6, 2	2008-05-06
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device Grant 7,362,034 - Nakaso , et al. April 22, 2	2008-04-22
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device App 20070247020 - Nakaso; Noritaka ; et al.	2007-10-25
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device App 20070247022 - Nakaso; Noritaka ; et al.	2007-10-25
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device App 20070247021 - Nakaso; Noritaka ; et al.	2007-10-25
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device App 20070241638 - Nakaso; Noritaka ; et al.	2007-10-18
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device App 20070241639 - Nakaso; Noritaka ; et al.	2007-10-18
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device Grant 7,247,969 - Nakaso , et al. July 24, 2	2007-07-24
Environment difference detector App 20070084284 - Nakaso; Noritake ; et al.	2007-04-19
Sensor head, gas sensor and sensor unit App 20070041870 - Yamanaka; Kazushi ; et al.	2007-02-22
Surface acoustic wave element, electric signal processing apparatus using the surface acoustic wave element, environment evaluating apparatus using the electric signal processing apparatus, and analyzing method using the surface acoustic wave element Grant 7,170,213 - Yamanaka , et al. January 30, 2	2007-01-30
Surface acoustic wave device and environmental difference detecting apparatus using the surface acoustic wave device App 20060214537 - Nakaso; Noritaka ; et al.	2006-09-28
Specimen observation method in atomic force microscopy and atomic force microscope Grant 6,983,644 - Yamanaka , et al. January 10, 2	2006-01-10
Surface acoustic wave element, electric signal processing apparatus using the surface acoustic wave element, environment evaluating apparatus using the electric signal processing apparatus, and analyzing method using the surface acoustic wave element App 20040189148 - Yamanaka, Kazushi ; et al.	2004-09-30
Specimen observation method in atomic force microscopy and atomic force microscope App 20020166368 - Yamanaka, Kazushi ; et al.	2002-11-14
Elastic surface-wave device App 20020014809 - Tsukahara, Yusuke ; et al.	2002-02-07
Method using cantilever to measure physical properties Grant 6,006,593 - Yamanaka December 28, 1	1999-12-28
Atomic force microscope and method of analyzing frictions in atomic force microscope Grant 5,804,708 - Yamanaka , et al. September 8, 1	1998-09-08
Directional atomic force microscope and method of observing a sample with the microscope Grant 5,503,010 - Yamanaka April 2, 1	1996-04-02

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