YAMANAKA; Hitoshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for YAMANAKA; Hitoshi.The latest application filed is for "semiconductor device and memory test method".

Company Profile

0.5.6

YAMANAKA; Hitoshi - Kawasaki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor Device And Memory Test Method App 20140068193 - YAMANAKA; Hitoshi ; et al.	2014-03-06
Semiconductor Integrated Circuit And Method Of Testing Semiconductor Integrated Circuit App 20130163356 - Yanagida; Masahiro ; et al.	2013-06-27
Storage circuit, integrated circuit, and scanning method Grant 8,356,217 - Yamanaka , et al. January 15, 2	2013-01-15
Storage Circuit, Integrated Circuit, And Scanning Method App 20100332930 - YAMANAKA; Hitoshi ; et al.	2010-12-30
Testing apparatus and testing method for an integrated circuit, and integrated circuit Grant 7,734,973 - Hiraide , et al. June 8, 2	2010-06-08
Multicore processor test method Grant 7,353,440 - Ohwada , et al. April 1, 2	2008-04-01
Testing apparatus and testing method for an integrated circuit, and integrated circuit App 20070168816 - Hiraide; Takahisa ; et al.	2007-07-19
Testing apparatus and testing method for an integrated circuit, and integrated circuit Grant 7,178,078 - Hiraide , et al. February 13, 2	2007-02-13
Multicore processor test method App 20050240850 - Ohwada, Akihiko ; et al.	2005-10-27
Testing apparatus and testing method for an integrated circuit, and integrated circuit App 20020124217 - Hiraide, Takahisa ; et al.	2002-09-05

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