Yamakawa; Yumika
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yamakawa; Yumika.The latest application filed is for "method of evaluating skin conditions and method of estimating skin thickness".
- Yamakawa; Yumika - Yokohama JP
- Yamakawa; Yumika - Yokohama-shi JP
- Yamakawa; Yumika - Kanagawa JP
| Patent | Date |
|---|---|
| Method of evaluating skin conditions and method of estimating skin thickness Grant 7,820,972 - Miyamae , et al. October 26, 2 | 2010-10-26 |
| Method Of Evaluating Skin Conditions And Method Of Estimating Skin Thickness App 20090134331 - Miyamae; Yuta ; et al. | 2009-05-28 |
| Method of judging degree of hair damage App 20060281994 - Miyamae; Yuta ; et al. | 2006-12-14 |
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