Yamaguchi; Norie
Patent Applications and Registrations
Patent applications and USPTO patent grants for Yamaguchi; Norie.The latest application filed is for "inspection unit, probe card, inspection device, and control system for inspection device".
- Yamaguchi; Norie - Tokyo JP
| Patent | Date |
|---|---|
| Inspection unit, probe card, inspection device, and control system for inspection device Grant 9,910,089 - Washio , et al. March 6, 2 | 2018-03-06 |
| Probe block, probe card and probe apparatus both having the probe block Grant 9,207,260 - Ogasawara , et al. December 8, 2 | 2015-12-08 |
| Inspection Unit, Probe Card, Inspection Device, And Control System For Inspection Device App 20140118018 - WASHIO; Kenichi ; et al. | 2014-05-01 |
| Inspection apparatus and inspection method for light emitting device Grant 8,699,035 - Jimbo , et al. April 15, 2 | 2014-04-15 |
| Probe Block, Probe Card And Probe Apparatus Both Having The Probe Block App 20130113512 - OGASAWARA; Takashi ; et al. | 2013-05-09 |
| Inspection Apparatus And Inspection Method For Light Emitting Device App 20130050691 - JIMBO; Syu ; et al. | 2013-02-28 |
| Probe card Grant 6,271,674 - Hasegawa , et al. August 7, 2 | 2001-08-07 |
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