loadpatents
name:-0.030478000640869
name:-0.038596153259277
name:-0.0048420429229736
Yamaguchi; Atsuko Patent Filings

Yamaguchi; Atsuko

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yamaguchi; Atsuko.The latest application filed is for "image analysis apparatus and charged particle beam apparatus".

Company Profile
3.36.25
  • Yamaguchi; Atsuko - Tokyo JP
  • Yamaguchi; Atsuko - Wako JP
  • Yamaguchi; Atsuko - Kodaira N/A JP
  • Yamaguchi; Atsuko - Wako-shi JP
  • Yamaguchi; Atsuko - Kanagawa-ken JP
  • Yamaguchi; Atsuko - Kudaira JP
  • Yamaguchi; Atsuko - Saitama JP
  • Yamaguchi; Atsuko - Higashimatsuyama JP
  • Yamaguchi, Atsuko - Higashimatsuyama-shi JP
  • Yamaguchi; Atsuko - Kawasaki JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Image analysis apparatus and charged particle beam apparatus
Grant 10,724,856 - Yamaguchi , et al.
2020-07-28
Inspection device
Grant 10,672,119 - Yamaguchi , et al.
2020-06-02
Image Analysis Apparatus And Charged Particle Beam Apparatus
App 20190204247 - YAMAGUCHI; Atsuko ;   et al.
2019-07-04
Inspection Device
App 20180308228 - YAMAGUCHI; Atsuko ;   et al.
2018-10-25
Charged particle beam device and inspection device
Grant 9,824,938 - Yamaguchi , et al. November 21, 2
2017-11-21
Method and device for line pattern shape evaluation
Grant 9,658,063 - Yamaguchi , et al. May 23, 2
2017-05-23
Charged Particle Beam Device And Inspection Device
App 20170040230 - Yamaguchi; Atsuko ;   et al.
2017-02-09
Suspension structure for irregular ground traveling vehicle
Grant 9,421,955 - Kuwabara , et al. August 23, 2
2016-08-23
Method And Device For Line Pattern Shape Evaluation
App 20160123726 - YAMAGUCHI; Atsuko ;   et al.
2016-05-05
Image processing apparatus
Grant 9,183,622 - Toyoda , et al. November 10, 2
2015-11-10
Semiconductor inspection device and semiconductor inspection method using the same
Grant 9,123,504 - Yamaguchi , et al. September 1, 2
2015-09-01
Suspension Structure For Irregular Ground Traveling Vehicle
App 20150210234 - Kuwabara; Naoki ;   et al.
2015-07-30
Method and apparatus for measuring displacement between patterns and scanning electron microscope installing unit for measuring displacement between patterns
Grant 9,000,366 - Yamaguchi , et al. April 7, 2
2015-04-07
Image Processing Apparatus And Computer Program
App 20130279793 - Toyoda; Yasutaka ;   et al.
2013-10-24
Method And Apparatus For Measuring Displacement Between Patterns And Scanning Electron Microscope Installing Unit For Measuring Displacement Between Patterns
App 20130264479 - YAMAGUCHI; Atsuko ;   et al.
2013-10-10
Apparatus for evaluating degradation of pattern features
Grant 8,401,273 - Momonoi , et al. March 19, 2
2013-03-19
Length measurement system
Grant 8,369,602 - Yamaguchi , et al. February 5, 2
2013-02-05
Apparatus for data analysis
Grant 8,300,919 - Yamaguchi , et al. October 30, 2
2012-10-30
Semiconductor Inspection Device And Semiconductor Inspection Method Using The Same
App 20120098954 - Yamaguchi; Atsuko ;   et al.
2012-04-26
Microphone-unit supporting structure and electronic device
App 20110188695 - Yamaguchi; Atsuko ;   et al.
2011-08-04
Apparatus For Evaluating Degradation Of Pattern Features
App 20110176718 - MOMONOI; Yoshinori ;   et al.
2011-07-21
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication
Grant 7,684,937 - Yamaguchi , et al. March 23, 2
2010-03-23
High-accuracy pattern shape evaluating method and apparatus
Grant 7,619,751 - Yamaguchi , et al. November 17, 2
2009-11-17
Apparatus For Data Analysis
App 20090263024 - YAMAGUCHI; Atsuko ;   et al.
2009-10-22
Length Measurement System
App 20090046896 - YAMAGUCHI; Atsuko ;   et al.
2009-02-19
Seat mount structure for saddle ride type vehicle
Grant 7,451,857 - Hasegawa , et al. November 18, 2
2008-11-18
High-accuracy Pattern Shape Evaluating Method And Apparatus
App 20080226177 - Yamaguchi; Atsuko ;   et al.
2008-09-18
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication
App 20080215274 - Yamaguchi; Atsuko ;   et al.
2008-09-04
High-accuracy pattern shape evaluating method and apparatus
Grant 7,405,835 - Yamaguchi , et al. July 29, 2
2008-07-29
Method and apparatus for circuit pattern inspection
Grant 7,369,703 - Yamaguchi , et al. May 6, 2
2008-05-06
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication
Grant 7,366,620 - Yamaguchi , et al. April 29, 2
2008-04-29
Vehicle wheel
Grant 7,290,838 - Handa , et al. November 6, 2
2007-11-06
High-accuracy pattern shape evaluating method and apparatus
App 20070242885 - Yamaguchi; Atsuko ;   et al.
2007-10-18
High-accuracy pattern shape evaluating method and apparatus
Grant 7,230,723 - Yamaguchi , et al. June 12, 2
2007-06-12
Method and apparatus for circuit pattern inspection
App 20060269121 - Yamaguchi; Atsuko ;   et al.
2006-11-30
Method and apparatus for circuit pattern inspection
Grant 7,095,884 - Yamaguchi , et al. August 22, 2
2006-08-22
High-accuracy pattern shape evaluating method and apparatus
App 20060145076 - Yamaguchi; Atsuko ;   et al.
2006-07-06
Pattern inspection method
Grant 7,049,589 - Yamaguchi , et al. May 23, 2
2006-05-23
Seat mount structure for saddle ride type vehicle
App 20060049006 - Hasegawa; Yosuke ;   et al.
2006-03-09
Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication
App 20060036409 - Yamaguchi; Atsuko ;   et al.
2006-02-16
Vehicle wheel
App 20050168054 - Handa, Akio ;   et al.
2005-08-04
Pattern inspection method
App 20040195507 - Yamaguchi, Atsuko ;   et al.
2004-10-07
Document retrieval assisting method and system for the same and document retrieval service using the same
Grant 6,745,183 - Nishioka , et al. June 1, 2
2004-06-01
Computer program embodied on a computer-readable medium for a document retrieval service that retrieves documents with a retrieval service agent computer
Grant 6,654,738 - Nishioka , et al. November 25, 2
2003-11-25
Wheel structure
Grant 6,644,756 - Handa , et al. November 11, 2
2003-11-11
Method and apparatus for circuit pattern inspection
App 20030021463 - Yamaguchi, Atsuko ;   et al.
2003-01-30
Document retrieval assisting method and system for the same and document retrieval service using the same
App 20020178153 - Nishioka, Shingo ;   et al.
2002-11-28
Document retrieval assisting method, system and service using closely displayed areas for titles and topics
Grant 6,457,004 - Nishioka , et al. September 24, 2
2002-09-24
Document retrieval assisting method and system for the same and document retrieval service using the same
Grant 6,446,065 - Nishioka , et al. September 3, 2
2002-09-03
Document retrieval assisting method and system for the same and document retrieval service using the same
App 20020042792 - Nishioka, Shingo ;   et al.
2002-04-11
Dust cover structure for a power transmission member
Grant 6,182,785 - Handa , et al. February 6, 2
2001-02-06
I/O card, cable connected to the I/O card, and method for saving power of I/O card
Grant 5,727,168 - Inoue , et al. March 10, 1
1998-03-10
Tape cartridge for tape writing machine
Grant D347,241 - Watanabe , et al. May 24, 1
1994-05-24
Label printer
Grant D344,752 - Watanabe , et al. March 1, 1
1994-03-01
Combined clock, timer and schedule manager
Grant D331,018 - Watanabe , et al. November 17, 1
1992-11-17
Combined instant camera and printer
Grant D329,862 - Watanabe , et al. September 29, 1
1992-09-29

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