loadpatents
name:-0.035460233688354
name:-0.023144006729126
name:-0.00081992149353027
Yakabe; Masami Patent Filings

Yakabe; Masami

Patent Applications and Registrations

Patent applications and USPTO patent grants for Yakabe; Masami.The latest application filed is for "interposer and manufacturing method for the same".

Company Profile
0.19.29
  • Yakabe; Masami - Tokyo JP
  • Yakabe; Masami - Minato-ku JP
  • Yakabe; Masami - Amagasaki JP
  • Yakabe; Masami - Hyogo JP
  • Yakabe, Masami - Amagasaki-shi JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Interposer And Manufacturing Method For The Same
App 20120085655 - Kagawa; Kenichi ;   et al.
2012-04-12
Displacement measurement apparatus for microstructure and displcement measurement method thereof
Grant 8,141,426 - Ikeuchi , et al. March 27, 2
2012-03-27
Pressure wave generator and temperature controlling method thereof
Grant 8,130,593 - Hayashi , et al. March 6, 2
2012-03-06
Switch array
Grant 7,994,443 - Hayashi , et al. August 9, 2
2011-08-09
Interposer, Probe Card And Method For Manufacturing The Interposer
App 20110109338 - Yakabe; Masami ;   et al.
2011-05-12
Method for manufacturing an interposer
Grant 7,891,090 - Yakabe , et al. February 22, 2
2011-02-22
Through substrate, interposer and manufacturing method of through substrate
Grant 7,866,038 - Yakabe , et al. January 11, 2
2011-01-11
Device, method and program for inspecting microstructure
Grant 7,726,190 - Matsumoto , et al. June 1, 2
2010-06-01
Pressure Wave Generator And Temperature Controlling Method Thereof
App 20100025145 - Hayashi; Masato ;   et al.
2010-02-04
Capacitance detection circuit and capacitance detection method
Grant 7,557,590 - Yakabe July 7, 2
2009-07-07
Displacement Measurement apparatus for microstructure and displcement measurement method thereof
App 20090145230 - Ikeuchi; Naoki ;   et al.
2009-06-11
Microstructure Probe Card, and Microstructure Inspecting Device, Method, and Computer Program
App 20090128171 - Okumura; Katsuya ;   et al.
2009-05-21
Switch Array
App 20090045039 - Hayashi; Masato ;   et al.
2009-02-19
Microstructure Inspecting Apparatus And Microstructure Inspecting Method
App 20090039908 - Ikeuchi; Naoki ;   et al.
2009-02-12
Microstructure Inspecting Apparatus and Microstructure Inspecting Method
App 20080302185 - Yakabe; Masami ;   et al.
2008-12-11
Minute structure inspection device, inspection method, and inspection program
App 20080223136 - Yakabe; Masami ;   et al.
2008-09-18
Device, Method and Program for Inspecting Microstructure
App 20080190206 - Matsumoto; Toshiyuki ;   et al.
2008-08-14
Interposer, Probe Card and Method for Manufacturing the Interposer
App 20080171452 - Yakabe; Masami ;   et al.
2008-07-17
Capacitance Detection Circuit and and Capacitance Detection Method
App 20080150553 - Yakabe; Masami
2008-06-26
Device for inspecting micro structure, method for inspecting micro structure and program for inspecting micro structure
Grant 7,383,732 - Okumura , et al. June 10, 2
2008-06-10
Potential fixing device and potential fixing method
Grant 7,368,920 - Yakabe May 6, 2
2008-05-06
Probing card and inspection apparatus for microstructure
Grant 7,348,788 - Yakabe , et al. March 25, 2
2008-03-25
Interposer And Manufacturing Method For The Same
App 20080067073 - Kagawa; Kenichi ;   et al.
2008-03-20
Semiconductor Device
App 20070278650 - Kagawa; Kenichi ;   et al.
2007-12-06
Probe
App 20070257692 - Yakabe; Masami ;   et al.
2007-11-08
Through Substrate, Interposer and Manufacturing Method of Through Substrate
App 20070246253 - Yakabe; Masami ;   et al.
2007-10-25
Capacity detection type sensor element
App 20070193358 - Kagawa; Kenichi ;   et al.
2007-08-23
Probing card and inspection apparatus for microstructure
App 20070069746 - Yakabe; Masami ;   et al.
2007-03-29
Sensor capacity sensing apparatus and sensor capacity sensing method
Grant 7,088,112 - Yakabe August 8, 2
2006-08-08
Potential fixing device, potential fixing method, and capacitance measuring instrument
Grant 7,046,016 - Yakabe , et al. May 16, 2
2006-05-16
Electrostatic capacitance detection circuit and microphone device
Grant 7,034,551 - Yakabe , et al. April 25, 2
2006-04-25
Impedance measuring circuit and capacitance measuring circuit
Grant 7,023,223 - Yakabe , et al. April 4, 2
2006-04-04
Electrostatic capacitance detection circuit and microphone device
Grant 7,019,540 - Yakabe , et al. March 28, 2
2006-03-28
Circuit and method for impedance detection
Grant 7,005,865 - Yakabe , et al. February 28, 2
2006-02-28
Device for inspecting micro structure, method for inspecting micro structure and program for inspecting micro structure
App 20050279170 - Okumura, Katsuya ;   et al.
2005-12-22
Potential fixing device, potential fixing method, and capacitance mearuing instrument
App 20050116700 - Yakabe, Masami ;   et al.
2005-06-02
Logarithmic digital to analog converter having multipliers coupled to reference voltages
Grant 6,900,751 - Yakabe May 31, 2
2005-05-31
Capacitance measuring circuit, capacitance measuring instrument, and microphone device
App 20050040833 - Yakabe, Masami ;   et al.
2005-02-24
Sensor capacity sensing apparatus and sensor capacity sensing method
App 20050036271 - Yakabe, Masami
2005-02-17
Impedance measuring circuit, it's method, and capacitance measuring circuit
App 20050035771 - Yakabe, Masami ;   et al.
2005-02-17
Impedance measuring circuit and capacitance measuring circuit
App 20050030046 - Yakabe, Masami ;   et al.
2005-02-10
Potential fixing device and potential fixing method
App 20050030679 - Yakabe, Masami
2005-02-10
Capacitance measuring circuit capacitance measuring instrument and microphone device
App 20050017737 - Yakabe, Masami ;   et al.
2005-01-27
Logarithmic A/D converter, a logarithmic A/D conversion method, a logarithmic D/A converter, a logarithmic D/A conversion method, and a physical quantity measuring system
App 20040263371 - Yakabe, Masami
2004-12-30
Impedance detection circuit, impedance detection device, and impedance detection method
Grant 6,756,790 - Yakabe , et al. June 29, 2
2004-06-29
Logarithmic a/d converter, method of logarithmic a/d conversion logarithmic d/a converter, method of logarithmic d/a conversion, and system for measuring physical quantity
Grant 6,633,247 - Yakabe October 14, 2
2003-10-14
Logarithmic a/d converter, method of logarithmic a/d conversion logarithmic d/a converter, method of logarithmic d/a conversion, and system for measuring physical quantity
App 20020181257 - Yakabe, Masami
2002-12-05
Impedance detection circuit, impedance detector and method of impedance detection
App 20020171454 - Yakabe, Masami ;   et al.
2002-11-21

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