YAHASHI; AKIRA

Patent Applications and Registrations

Patent applications and USPTO patent grants for YAHASHI; AKIRA.The latest application filed is for "workpiece surface defect detection device and detection method, workpiece surface inspection system, and program".

Company Profile

0.6.3

YAHASHI; AKIRA - Higashinada-ku Kobe-shi
Yahashi; Akira - Kobe JP
Yahashi, Akira - Kobe-Shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Workpiece Surface Defect Detection Device And Detection Method, Workpiece Surface Inspection System, And Program App 20220292665 - UEKI; SHOTA ; et al.	2022-09-15
Three-dimensional measuring method and device, and computer program Grant 6,853,458 - Yahashi , et al. February 8, 2	2005-02-08
Three-dimensional measuring method and system Grant 6,847,360 - Yahashi January 25, 2	2005-01-25
Measuring apparatus and measuring method Grant 6,614,537 - Yahashi September 2, 2	2003-09-02
Three-dimensional measuring method and device, and computer program App 20030026475 - Yahashi, Akira ; et al.	2003-02-06
Three-dimensional measuring method and system App 20020118274 - Yahashi, Akira	2002-08-29
Three-dimensional measurement method and three-dimensional measurement device Grant 6,297,881 - Yahashi , et al. October 2, 2	2001-10-02
Three-dimensional measuring device and three-dimensional measuring method Grant 6,141,105 - Yahashi , et al. October 31, 2	2000-10-31
Distance measuring apparatus capable of measuring a distance depending on moving status of a moving object Grant 5,760,884 - Yahashi , et al. June 2, 1	1998-06-02

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