YAGUCHI; Toshie

Patent Applications and Registrations

Patent applications and USPTO patent grants for YAGUCHI; Toshie.The latest application filed is for "transmission electron microscope and inspection method using transmission electron microscope".

Company Profile

4.21.19

YAGUCHI; Toshie - Tokyo JP
Yaguchi; Toshie - Omitama N/A JP
Yaguchi; Toshie - Higashiibaraki JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Transmission Electron Microscope and Inspection Method Using Transmission Electron Microscope App 20220244201 - YAGUCHI; Toshie ; et al.	2022-08-04
Specimen holder and charged particle beam device provided with same Grant 11,177,109 - Yaguchi , et al. November 16, 2	2021-11-16
Specimen holder and charged particle beam device provided with same Grant 11,133,150 - Yaguchi , et al. September 28, 2	2021-09-28
Charged particle beam device for moving an aperture having plurality of openings and sample observation method Grant 10,636,621 - Hanawa , et al.	2020-04-28
Electron microscope and imaging method Grant 10,535,497 - Tamaki , et al. Ja	2020-01-14
Specimen Holder and Charged Particle Beam Device Provided with Same App 20190180978 - YAGUCHI; Toshie ; et al.	2019-06-13
Electron Microscope And Imaging Method App 20190131107 - TAMAKI; Hirokazu ; et al.	2019-05-02
Charged particle beam device and sample holder for charged particle beam device Grant 10,068,745 - Yaguchi , et al. September 4, 2	2018-09-04
Charged Particle Beam Device and Sample Observation Method App 20180076004 - HANAWA; Akinari ; et al.	2018-03-15
Electron microscope and sample observation method Grant 9,754,762 - Yaguchi , et al. September 5, 2	2017-09-05
Electron Microscope And Sample Observation Method App 20170133195 - Yaguchi; Toshie ; et al.	2017-05-11
Charged Particle Beam Device and Sample Holder for Charged Particle Beam Device App 20160217971 - YAGUCHI; Toshie ; et al.	2016-07-28
Electron microscope and electron microscope sample retaining device Grant 9,378,922 - Yaguchi , et al. June 28, 2	2016-06-28
Charged particle radiation apparatus, and method for displaying three-dimensional information in charged particle radiation apparatus Grant 9,099,281 - Yaguchi , et al. August 4, 2	2015-08-04
Electron Microscope And Electron Microscope Sample Retaining Device App 20150179396 - Yaguchi; Toshie ; et al.	2015-06-25
Electron microscope and sample holder Grant 8,878,144 - Yaguchi , et al. November 4, 2	2014-11-04
Sample holding apparatus for electron microscope, and electron microscope apparatus Grant 8,835,847 - Yaguchi , et al. September 16, 2	2014-09-16
Sample Holding Apparatus For Electron Microscope, And Electron Microscope Apparatus App 20140042318 - Yaguchi; Toshie ; et al.	2014-02-13
Electron beam device and sample holding device for electron beam device Grant 8,604,429 - Yaguchi , et al. December 10, 2	2013-12-10
Image processing method, image processing system, and X-ray computed tomography system Grant 8,588,499 - Kubo , et al. November 19, 2	2013-11-19
Image Processing Method, Image Processing System, and X-Ray Computed Tomography System App 20130202180 - Kubo; Takashi ; et al.	2013-08-08
Electron Microscope And Sample Holder App 20120305769 - Yaguchi; Toshie ; et al.	2012-12-06
Charged Particle Radiation Apparatus, and Method for Displaying Three-Dimensional Information in Charged Particle Radiation Apparatus App 20120212583 - Yaguchi; Toshie ; et al.	2012-08-23
Electron Beam Device And Sample Holding Device For Electron Beam Device App 20110303845 - Yaguchi; Toshie ; et al.	2011-12-15
Electric charged particle beam microscope and microscopy Grant 7,863,564 - Tsuneta , et al. January 4, 2	2011-01-04
Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus Grant 7,622,714 - Yaguchi , et al. November 24, 2	2009-11-24
Focused ion beam system and a method of sample preparation and observation Grant 7,612,337 - Suzuki , et al. November 3, 2	2009-11-03
Electric Charged Particle Beam Microscope And Microscopy App 20090127474 - TSUNETA; Ruriko ; et al.	2009-05-21
Charged particle beam system and its specimen holder App 20080093565 - Yaguchi; Toshie ; et al.	2008-04-24
Standard specimen for a charged particle beam apparatus, specimen preparation method thereof, and charged particle beam apparatus App 20080073521 - Yaguchi; Toshie ; et al.	2008-03-27
Focused ion beam system and a method of sample preparation and observation App 20070187597 - Suzuki; Yuya ; et al.	2007-08-16
Material characterization system Grant 6,992,286 - Yaguchi , et al. January 31, 2	2006-01-31
Material characterization system App 20040183012 - Yaguchi, Toshie ; et al.	2004-09-23

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