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Patent applications and USPTO patent grants for Xitronix Corporation.The latest application filed is for "method and apparatus of z-scan photoreflectance characterization".
Patent | Date |
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Method And Apparatus Of Z-scan Photoreflectance Characterization App 20120327420 - Chism, II; William W. | 2012-12-27 |
Method and apparatus of z-scan photoreflectance characterization Grant 8,300,227 - Chism, II October 30, 2 | 2012-10-30 |
Method and Apparatus of Z-Scan Photoreflectance Characterization App 20100315646 - CHISM, II; William W. | 2010-12-16 |
Method of photo-reflectance characterization of strain and active dopant in semiconductor structures Grant 7,391,507 - Chism, II June 24, 2 | 2008-06-24 |
Polarization modulation photoreflectance characterization of semiconductor electronic interfaces Grant 7,239,392 - Chism, II July 3, 2 | 2007-07-03 |
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