Xin; Yongchun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Xin; Yongchun.The latest application filed is for "mems optical liquid level sensor".

Company Profile

8.20.17

Xin; Yongchun - Poughkeepsie NY
Xin; Yongchun - Pouhgkeepsie NY
Xin; Yongchun - Hopewell Junction NY US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Micro electrical mechanical system (MEMS) valve Grant 11,187,349 - Xin , et al. November 30, 2	2021-11-30
MEMS optical liquid level sensor Grant 11,161,110 - Fry , et al. November 2, 2	2021-11-02
Micro electrical mechanical system (MEMS) multiplexing mixing Grant 10,898,871 - Fry , et al. January 26, 2	2021-01-26
Micro electrical mechanical system (MEMS) valve Grant 10,612,691 - Xin , et al.	2020-04-07
Mems Optical Liquid Level Sensor App 20200061611 - Fry; Jonathan ; et al.	2020-02-27
Self-cleaning liquid level sensor Grant 10,551,240 - Fry , et al. Fe	2020-02-04
Micro Electrical Mechanical System (mems) Multiplexing Mixing App 20200001257 - Fry; Jonathan ; et al.	2020-01-02
MEMS optical sensor Grant 10,458,909 - Fry , et al. Oc	2019-10-29
Micro Electrical Mechanical System (mems) Valve App 20190323627 - XIN; YONGCHUN ; et al.	2019-10-24
Micro electrical mechanical system (MEMS) valve Grant 10,415,721 - Xin , et al. Sept	2019-09-17
Micro Electrical Mechanical System (mems) Valve App 20190219192 - XIN; Yongchun ; et al.	2019-07-18
Micro Electrical Mechanical System (mems) Valve App 20190219193 - XIN; Yongchun ; et al.	2019-07-18
Self-cleaning Liquid Level Sensor App 20190162578 - Fry; Jonathan ; et al.	2019-05-30
LCR test circuit structure for detecting metal gate defect conditions Grant 9,780,007 - Ouyang , et al. October 3, 2	2017-10-03
Semiconductor wafer probing system including pressure sensing and control unit Grant 9,702,930 - Edwards , et al. July 11, 2	2017-07-11
Method for manufacturing in a semiconductor device a low resistance via without a bottom liner Grant 9,559,051 - Xin , et al. January 31, 2	2017-01-31
Voltage contrast characterization structures and methods for within chip process variation characterization Grant 9,519,210 - Patterson , et al. December 13, 2	2016-12-13
Pressure Sensing And Control For Semiconductor Wafer Probing App 20160216321 - Edwards; Robert D. ; et al.	2016-07-28
Pressure sensing and control for semiconductor wafer probing Grant 9,354,252 - Edwards , et al. May 31, 2	2016-05-31
Voltage Contrast Characterization Structures And Methods For Within Chip Process Variation Characterization App 20160148849 - Patterson; Oliver D. ; et al.	2016-05-26
Pressure Sensing And Control For Semiconductor Wafer Probing App 20150145544 - Edwards; Robert D. ; et al.	2015-05-28
Pressure sensing and control for semiconductor wafer probing Grant 8,963,567 - Edwards , et al. February 24, 2	2015-02-24
Random coded integrated circuit structures and methods of making random coded integrated circuit structures Grant 8,803,328 - Song , et al. August 12, 2	2014-08-12
Random Coded Integrated Circuit Structures And Methods Of Making Random Coded Integrated Circuit Structures App 20140203448 - Song; Yunsheng ; et al.	2014-07-24
Noncontact electrical testing with optical techniques Grant 8,742,782 - Ouyang , et al. June 3, 2	2014-06-03
Wafer alignment system with optical coherence tomography Grant 8,489,225 - Xin , et al. July 16, 2	2013-07-16
Lcr Test Circuit Structure For Detecting Metal Gate Defect Conditions App 20130169308 - Ouyang; Xu ; et al.	2013-07-04
Pressure Sensing And Control For Semiconductor Wafer Probing App 20130106455 - Edwards; Robert D. ; et al.	2013-05-02
Noncontact Electrical Testing With Optical Techniques App 20130027051 - Ouyang; Xu ; et al.	2013-01-31
Wafer Alignment System With Optical Coherence Tomography App 20120232686 - Xin; Yongchun ; et al.	2012-09-13

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.