Xie; Xinyun

Patent Applications and Registrations

Patent applications and USPTO patent grants for Xie; Xinyun.The latest application filed is for "method for manufacturing semiconductor device".

Company Profile

1.14.16

Xie; Xinyun - Shanghai CN

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for manufacturing semiconductor device Grant 10,957,785 - Xie March 23, 2	2021-03-23
Method For Manufacturing Semiconductor Device App 20190326418 - XIE; Xinyun	2019-10-24
Method for manufacturing semiconductor device Grant 10,381,464 - Xie A	2019-08-13
Fin-type semiconductor device Grant 10,312,333 - Xie , et al.	2019-06-04
FinFET devices having a material formed on reduced source/drain region Grant 10,290,724 - Xie	2019-05-14
Method For Manufacturing Semiconductor Device App 20180337265 - XIE; Xinyun	2018-11-22
Semiconductor device and FinFET transistor Grant 10,134,761 - Xie , et al. November 20, 2	2018-11-20
Fin-type Semiconductor Device App 20180175151 - XIE; XINYUN ; et al.	2018-06-21
Semiconductor device having improved core and input/output device reliability Grant 9,985,015 - Xie May 29, 2	2018-05-29
Fabricating method of fin-type semiconductor device Grant 9,923,065 - Xie , et al. March 20, 2	2018-03-20
FINFET structure and method of forming same Grant 9,899,380 - Xie , et al. February 20, 2	2018-02-20
Semiconductor Device And Finfet Transistor App 20180006063 - XIE; XINYUN ; et al.	2018-01-04
Semiconductor device, FinFET transistor and fabrication method thereof Grant 9,799,676 - Xie , et al. October 24, 2	2017-10-24
Finfet Devices Having A Material Formed On Reduced Source/drain Region App 20170229559 - XIE; XINYUN	2017-08-10
FinFET device having a material formed on reduced source/drain region and method of forming the same Grant 9,673,325 - Xie June 6, 2	2017-06-06
FinFET and fabrication method thereof Grant 9,634,087 - Xie April 25, 2	2017-04-25
Semiconductor Device Having Improved Core And Input/output Device Reliability App 20170040310 - XIE; XINYUN	2017-02-09
Semiconductor Device And Fabricating Method Thereof App 20170033190 - XIE; XINYUN ; et al.	2017-02-02
Semiconductor Device, Finfet Transistor And Fabrication Method Thereof App 20160351591 - XIE; XINYUN ; et al.	2016-12-01
Method for core and in/out-put device reliability improve at high-K last process Grant 9,502,403 - Xie November 22, 2	2016-11-22
Semiconductor device and fabrication method thereof Grant 9,472,668 - Xie October 18, 2	2016-10-18
Finfet Structure And Method Of Forming Same App 20160240530 - XIE; XINYUN ; et al.	2016-08-18
Methods For Finfet Source/drain Formation And Finfet Devices App 20160093738 - XIE; XINYUN	2016-03-31
Semiconductor Device And Fabrication Method Thereof App 20160020325 - XIE; XINYUN	2016-01-21
Method for FinFET SRAM ratio tuning Grant 9,184,170 - Xie November 10, 2	2015-11-10
Method For Finfet Sram Ratio Tuning App 20150102423 - XIE; Xinyun	2015-04-16
Method For Core And In/out-put Device Reliability Improve At High-k Last Process App 20150035079 - XIE; XINYUN	2015-02-05
Sonos Structure And Manufacturing Method Thereof App 20130181279 - TIAN; Zhi ; et al.	2013-07-18
Multi-working Voltages Cmos Device With Single Gate Oxide Layer Thickness And Manufacturing Method Thereof App 20130049119 - HUANG; Xiaolu ; et al.	2013-02-28

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