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name:-0.0350341796875
name:-0.038892984390259
name:-0.027420997619629
Xie; Mayue Patent Filings

Xie; Mayue

Patent Applications and Registrations

Patent applications and USPTO patent grants for Xie; Mayue.The latest application filed is for "integrated cable probe design for high bandwidth rf testing".

Company Profile
7.16.19
  • Xie; Mayue - Phoenix AZ
  • Xie; Mayue - Syracuse NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Integrated circuit package with test circuitry for testing a channel between dies
Grant 11,450,613 - Xie , et al. September 20, 2
2022-09-20
Integrated cable probe design for high bandwidth RF testing
Grant 11,226,353 - Hu , et al. January 18, 2
2022-01-18
Integrated Cable Probe Design For High Bandwidth Rf Testing
App 20210132113 - Hu; Chengqing ;   et al.
2021-05-06
Method of resonance analysis for electrical fault isolation
Grant 10,935,593 - Goyal , et al. March 2, 2
2021-03-02
Characterization of transmission media
Grant 10,908,206 - Xie , et al. February 2, 2
2021-02-02
High power terahertz impulse for fault isolation
Grant 10,746,780 - Xie , et al. A
2020-08-18
Integrated Circuit Package With Test Circuitry For Testing A Channel Between Dies
App 20190295953 - XIE; Mayue ;   et al.
2019-09-26
Characterization Of Transmission Media
App 20190293708 - Xie; Mayue ;   et al.
2019-09-26
Method Of Resonance Analysis For Electrical Fault Isolation
App 20190204376 - Goyal; Deepak ;   et al.
2019-07-04
High Power Terahertz Impulse For Fault Isolation
App 20180335465 - Xie; Mayue ;   et al.
2018-11-22
Apparatus And Method For Classifying And Locating Electrical Faults In Circuitry
App 20180284185 - Xie; Mayue ;   et al.
2018-10-04
Apparatus and method for classifying and locating electrical faults in circuitry
Grant 10,088,518 - Xie , et al. October 2, 2
2018-10-02
Apparatus and method to monitor die edge defects
Grant 10,026,664 - Xie , et al. July 17, 2
2018-07-17
Terahertz transmission contactless probing and scanning for signal analysis and fault isolation
Grant 9,817,028 - Xie , et al. November 14, 2
2017-11-14
Apparatus And Method To Monitor Die Edge Defects
App 20170141006 - Xie; Mayue ;   et al.
2017-05-18
Terahertz Transmission Contactless Probing And Scanning For Signal Analysis And Fault Isolation
App 20170089951 - Xie; Mayue ;   et al.
2017-03-30
Apparatus and method to monitor die edge defects
Grant 9,564,381 - Xie , et al. February 7, 2
2017-02-07
Circuit Device Inspection Systems Using Temperature Gradients
App 20160274044 - Xie; Mayue ;   et al.
2016-09-22
Apparatus And Method To Monitor Die Edge Defects
App 20160043011 - Xie; Mayue ;   et al.
2016-02-11
Apparatus and method to monitor die edge defects
Grant 9,159,646 - Xie , et al. October 13, 2
2015-10-13
Apparatus And Method To Monitor Die Edge Defects
App 20140168879 - Xie; Mayue ;   et al.
2014-06-19
Connector compression tool
Grant 8,356,402 - Xie , et al. January 22, 2
2013-01-22
Connector Compression Tool
App 20120102728 - Xie; Mayue ;   et al.
2012-05-03
Method of compressing a connector
Grant 8,112,876 - Xie , et al. February 14, 2
2012-02-14
Connector compression tool
Grant 8,112,877 - Xie , et al. February 14, 2
2012-02-14
Connector Compression Tool And Method Of Use Thereof
App 20110041326 - Xie; Mayue ;   et al.
2011-02-24
Connector Compression Tool
App 20110041327 - Xie; Mayue ;   et al.
2011-02-24
Connector compression tool
Grant 7,823,271 - Xie , et al. November 2, 2
2010-11-02
Tool adaptor
Grant 7,607,218 - Montena , et al. October 27, 2
2009-10-27
Connector compression tool and method of use thereof
App 20060179646 - Xie; Mayue ;   et al.
2006-08-17
Tool adaptor
App 20060179647 - Montena; Noah ;   et al.
2006-08-17

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