Xia; Deying

Patent Applications and Registrations

Patent applications and USPTO patent grants for Xia; Deying.The latest application filed is for "inspection system and inspection method to qualify semiconductor structures".

Company Profile

1.8.5

Xia; Deying - Belmont MA
Xia; Deying - Albuquerque NM
Xia; Deying - Newton MA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection system and inspection method to qualify semiconductor structures Grant 11,378,532 - Lewis , et al. July 5, 2	2022-07-05
Inspection System And Inspection Method To Qualify Semiconductor Structures App 20210109046 - Lewis; Brett ; et al.	2021-04-15
Fabrication of enclosed nanochannels using silica nanoparticles Grant 9,156,004 - Brueck , et al. October 13, 2	2015-10-13
Fabrication of Enclosed Nanochannels Using Silica Nanoparticles App 20130193065 - Brueck; Steven R.J. ; et al.	2013-08-01
Fabrication of enclosed nanochannels using silica nanoparticles Grant 8,404,123 - Brueck , et al. March 26, 2	2013-03-26
Anisotropic wetting behavior on one-dimensional patterned surfaces for applications to microfluidic devices Grant 8,377,390 - Brueck , et al. February 19, 2	2013-02-19
Fabrication Of Enclosed Nanochannels Using Silica Nanoparticles App 20110011794 - Brueck; Steven R. J. ; et al.	2011-01-20
Fabrication of enclosed nanochannels using silica nanoparticles Grant 7,825,037 - Brueck , et al. November 2, 2	2010-11-02
Fabrication Of Enclosed Nanochannels Using Silica Nanoparticles App 20070134939 - Brueck; Steven R.J. ; et al.	2007-06-14

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