Wu; Feiyang

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wu; Feiyang.The latest application filed is for "electrode for use in measuring dielectric properties of parts".

Company Profile

0.7.6

Wu; Feiyang - San Francisco CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electrode for use in measuring dielectric properties of parts Grant 9,322,795 - Kim , et al. April 26, 2	2016-04-26
Electrode for Use in Measuring Dielectric Properties of Parts App 20130241581 - Kim; Jaehyun ; et al.	2013-09-19
Electrode for use in measuring dielectric properties of parts Grant 8,519,724 - Kim , et al. August 27, 2	2013-08-27
Apparatus for measuring dielectric properties of parts Grant 8,269,510 - Kim , et al. September 18, 2	2012-09-18
Methods for measuring dielectric properties of parts Grant 7,973,539 - Kim , et al. July 5, 2	2011-07-05
Methods For Measuring Dielectric Properties Of Parts App 20110140715 - Kim; Jaehyun ; et al.	2011-06-16
Methods for measuring dielectric properties of parts Grant 7,911,213 - Kim , et al. March 22, 2	2011-03-22
Methods for characterizing dielectric properties of parts Grant 7,777,500 - Kim , et al. August 17, 2	2010-08-17
Methods for Measuring Dielectric Properties of Parts App 20100079152 - Kim; Jaehyun ; et al.	2010-04-01
Apparatus for Measuring Dielectric Properties of Parts App 20090091340 - Kim; Jaehyun ; et al.	2009-04-09
Methods for Characterizing Dielectric Properties of Parts App 20090091335 - Kim; Jaehyun ; et al.	2009-04-09
Electrode for Use in Measuring Dielectric Properties of Parts App 20090091341 - Kim; Jaehyun ; et al.	2009-04-09

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