name:-0.0088398456573486
name:-0.0074141025543213
name:-0.00078320503234863
Wu; David M. Patent Filings

Wu; David M.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wu; David M..The latest application filed is for "scan architecture and design methodology yielding significant reduction in scan area and power overhead".

Company Profile
0.9.7
  • Wu; David M. - Pflugerville TX
  • Wu; David M. - Austin TX
  • Wu; David M. - Beaverton OR
  • Wu; David M. - Melbourne FL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Trademarks
Patent Activity
PatentDate
Scan architecture and design methodology yielding significant reduction in scan area and power overhead
Grant 8,321,730 - Jaber , et al. November 27, 2
2012-11-27
Scan Architecture And Design Methodology Yielding Significant Reduction In Scan Area And Power Overhead
App 20110161759 - Jaber; Talal K. ;   et al.
2011-06-30
Common test logic for multiple operation modes
Grant 7,734,972 - Jaber , et al. June 8, 2
2010-06-08
Common test logic for multiple operation modes
App 20090187799 - Jaber; Talal ;   et al.
2009-07-23
Method and apparatus for testing a memory array
Grant 7,370,249 - Bao , et al. May 6, 2
2008-05-06
Flexible scan architecture
App 20070168767 - Jaber; Talal K. ;   et al.
2007-07-19
Flexible scan architecture
Grant 7,216,274 - Jaber , et al. May 8, 2
2007-05-08
Method and apparatus for testing a memory array
App 20050283688 - Bao, Zhuoyu ;   et al.
2005-12-22
Flexible scan architecture
App 20040267504 - Jaber, Talal K. ;   et al.
2004-12-30
Scan cell systems and methods
Grant 6,815,977 - Sabbavarapu , et al. November 9, 2
2004-11-09
Weighted random pattern test using pre-stored weights
Grant 6,795,948 - Lin , et al. September 21, 2
2004-09-21
Scan cell systems and methods
App 20040119501 - Sabbavarapu, Anil K. ;   et al.
2004-06-24
Method and apparatus for providing rotational burn-in stress testing
Grant 6,683,467 - Keshavarzi , et al. January 27, 2
2004-01-27
Weighted random pattern test using pre-stored weights
App 20030074615 - Lin, Chih-Jen ;   et al.
2003-04-17
Method and system for modeling the behavior of a circuit
Grant 5,920,489 - Dibrino , et al. July 6, 1
1999-07-06
By-pass boundary scan design
Grant 5,042,034 - Correale, Jr. , et al. August 20, 1
1991-08-20

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