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Patent applications and USPTO patent grants for Wu; Chien-Chou.The latest application filed is for "apparatus for probing die electricity and method for forming the same".
Patent | Date |
---|---|
Probe device having spring probe Grant 9,746,495 - Wu , et al. August 29, 2 | 2017-08-29 |
Assembly method of direct-docking probing device Grant 9,651,578 - Wu , et al. May 16, 2 | 2017-05-16 |
Method for manufacturing space transformer by using carrier substrate made for chip package and provided with elongated contacts Grant 9,648,757 - Lee , et al. May 9, 2 | 2017-05-09 |
Probe needle and probe module using the same Grant 9,618,536 - Kuo , et al. April 11, 2 | 2017-04-11 |
Probe device having spring probe Grant 9,588,141 - Chen , et al. March 7, 2 | 2017-03-07 |
Spring probe Grant 9,535,092 - Kuo , et al. January 3, 2 | 2017-01-03 |
Apparatus for probing die electricity and method for forming the same Grant 9,506,978 - Lee , et al. November 29, 2 | 2016-11-29 |
Probing device Grant 9,347,971 - Wu , et al. May 24, 2 | 2016-05-24 |
Probe card and manufacturing method thereof Grant 9,341,648 - Lee , et al. May 17, 2 | 2016-05-17 |
Probing device and manufacturing method thereof Grant 9,234,917 - Wu , et al. January 12, 2 | 2016-01-12 |
Apparatus For Probing Die Electricity And Method For Forming The Same App 20150377957 - LEE; Chung-Tse ;   et al. | 2015-12-31 |
Probe Device Having Spring Probe App 20150276807 - CHEN; Tsung-Yi ;   et al. | 2015-10-01 |
Probe Device Having Spring Probe App 20150276806 - WU; Chien-Chou ;   et al. | 2015-10-01 |
Spring Probe App 20150253356 - KUO; Ting-Hsin ;   et al. | 2015-09-10 |
Manufacturing Method Of Probing Device App 20150185254 - Wu; Chien-Chou ;   et al. | 2015-07-02 |
Method For Manufacturing Space Transformer By Using Carrier Substrate Made For Chip Package And Provided With Elongated Contacts App 20150107102 - LEE; Chung-Tse ;   et al. | 2015-04-23 |
Assembly Method Of Direct-docking Probing Device App 20150033553 - Wu; Chien-Chou ;   et al. | 2015-02-05 |
Probe Needle and Probe Module Using the Same App 20140352460 - KUO; Chia-Yuan ;   et al. | 2014-12-04 |
Probe Card And Manufacturing Method Thereof App 20140077833 - LEE; Chung-Tse ;   et al. | 2014-03-20 |
Apparatus For Probing Die Electricity And Method For Forming The Same App 20130147507 - LEE; CHUNG-TSE ;   et al. | 2013-06-13 |
Probing Device And Manufacturing Method Thereof App 20130069686 - Wu; Chien-Chou ;   et al. | 2013-03-21 |
Probing Device App 20130033283 - Wu; Chien-Chou ;   et al. | 2013-02-07 |
Direct-docking Probing Device App 20120038383 - WU; Chien-Chou ;   et al. | 2012-02-16 |
Probe Card, Maintenance Apparatus And Method For The Same App 20110128028 - Lin; Chin-Yi ;   et al. | 2011-06-02 |
Apparatus and methods for Z-axis control and collision detection and recovery for waterjet cutting systems Grant 6,852,002 - Stewart , et al. February 8, 2 | 2005-02-08 |
Apparatus and methods for z-axis control and collision detection and recovery for waterjet cutting systems Grant 6,379,214 - Stewart , et al. April 30, 2 | 2002-04-30 |
Apparatus and methods for Z-axis control and collision detection and recovery for waterjet cutting systems App 20010027708 - Stewart, Jonathan M. ;   et al. | 2001-10-11 |
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