Wong; Yeak-Chong

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wong; Yeak-Chong.The latest application filed is for "advanced-process-control system utilizing a lambda tuner".

Company Profile

0.10.6

Wong; Yeak-Chong - San Jose CA US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Methods for providing run to run process control using a dynamic tuner Grant 9,213,322 - Feng , et al. December 15, 2	2015-12-15
Methods for providing asymmetric run to run control of process parameters Grant 9,110,465 - Feng , et al. August 18, 2	2015-08-18
Controlling the thickness of wafers during the electroplating process Grant 7,914,657 - Fu , et al. March 29, 2	2011-03-29
Advanced-process-control system utilizing a lambda tuner Grant 7,809,459 - Morisawa , et al. October 5, 2	2010-10-05
Run-to-run control of backside pressure for CMP radial uniformity optimization based on center-to-edge model Grant 7,722,436 - Guthrie , et al. May 25, 2	2010-05-25
Advanced-process-control system utilizing a lambda tuner App 20090171638 - Morisawa; Toshihiro ; et al.	2009-07-02
Run-To-Run Control Of Backside Pressure For CMP Radial Uniformity Optimization Based On Center-To-Edge Model App 20080020676 - Guthrie; Hung-Chin ; et al.	2008-01-24
Aggregated run-to-run process control for wafer yield optimization Grant 7,269,526 - Muro , et al. September 11, 2	2007-09-11
Run-to-run control of backside pressure for CMP radial uniformity optimization based on center-to-edge model Grant 7,264,535 - Guthrie , et al. September 4, 2	2007-09-04
Method for fabricating a pole tip in a magnetic transducer using feed-forward and feedback Grant 7,254,884 - Karimi , et al. August 14, 2	2007-08-14
Controlling the thickness of wafers during the electroplating process App 20070125656 - Fu; Wai B. ; et al.	2007-06-07
Aggregated run-to-run process control for wafer yield optimization App 20060265162 - Muro; Amelia Clara ; et al.	2006-11-23
Method for fabricating a pole tip in a magnetic transducer using feed-forward and feedback App 20060059680 - Karimi; Negar ; et al.	2006-03-23
Run-to-run control of backside pressure for CMP radial uniformity optimization based on center-to-edge model App 20050239222 - Guthrie, Hung-Chin ; et al.	2005-10-27

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.