WONG; Kok Weng
Patent Applications and Registrations
Patent applications and USPTO patent grants for WONG; Kok Weng.The latest application filed is for "method of color inspection by using monochrome imaging with multiple wavelengths of light".
- WONG; Kok Weng - Singapore SG
| Patent | Date |
|---|---|
| Method of Color Inspection by Using Monochrome Imaging With Multiple Wavelengths of Light App 20220159182 - WONG; Kok Weng ; et al. | 2022-05-19 |
| System And Method Of Object Inspection Using Multispectral 3d Laser Scanning App 20220107174 - WONG; Kok Weng ; et al. | 2022-04-07 |
| System and method for inspecting a wafer Grant 10,876,975 - Amanullah , et al. December 29, 2 | 2020-12-29 |
| System And Method For Inspecting A Wafer App 20190033233 - AMANULLAH; Ajharali ; et al. | 2019-01-31 |
| System and method for inspecting a wafer Grant 10,161,881 - Amanullah , et al. Dec | 2018-12-25 |
| Methods of inspecting a 3D object using 2D image processing Grant 10,151,580 - Wong , et al. Dec | 2018-12-11 |
| Methods Of Inspecting A 3d Object Using 2d Image Processing App 20170254639 - WONG; Kok Weng ; et al. | 2017-09-07 |
| System and method for inspecting a wafer App 20150233840 - Amanullah; Ajharali ; et al. | 2015-08-20 |
| System and method for inspecting a wafer App 20100188486 - Amanullah; Ajharali ; et al. | 2010-07-29 |
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