loadpatents
name:-0.0062119960784912
name:-0.0089309215545654
name:-0.00096797943115234
Wong; Justin Wai-chow Patent Filings

Wong; Justin Wai-chow

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wong; Justin Wai-chow.The latest application filed is for "multi-modal data analysis for defect identification".

Company Profile
0.8.7
  • Wong; Justin Wai-chow - South Burlington VT US
  • Wong; Justin Wai-Chow - Chittenden County VT
  • Wong; Justin Wai-chow - Burlington VT
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Multi-modal Data Analysis For Defect Identification
App 20130103336 - Amini; Lisa ;   et al.
2013-04-25
Multi-modal data analysis for defect identification
Grant 8,260,034 - Amini , et al. September 4, 2
2012-09-04
Hierarchical and incremental multivariate analysis for process control
Grant 8,233,494 - Amini , et al. July 31, 2
2012-07-31
Method and system for causal modeling and outlier detection
Grant 8,140,301 - Abe , et al. March 20, 2
2012-03-20
Multi-Modal Data Analysis for Defect Identification
App 20090185739 - Amini; Lisa ;   et al.
2009-07-23
Hierarchical and Incremental Multivariate Analysis for Process Control
App 20090185493 - Amini; Lisa ;   et al.
2009-07-23
Method and Computer Program Product for Wafer Manufacturing Process Abnormalities Detection
App 20090137068 - Rosen-Zvi; Michal ;   et al.
2009-05-28
Method And System For Causal Modeling And Outlier Detection
App 20080270088 - Abe; Naoki ;   et al.
2008-10-30
Measurement to determine plasma leakage
Grant 7,115,210 - Calderoni , et al. October 3, 2
2006-10-03
A Measurement To Determine Plasma Leakage
App 20050167396 - Calderoni, Robert A. ;   et al.
2005-08-04
Real time measurement of etch rate during a chemical etching process
Grant 5,788,801 - Barbee , et al. August 4, 1
1998-08-04
Apparatus for chemical vapor deposition of aluminum oxide
Grant 5,728,222 - Barbee , et al. March 17, 1
1998-03-17
Method of aluminum oxide low pressure chemical vapor deposition (LPCVD) system-fourier transform infrared (FTIR) source chemical control
Grant 5,665,608 - Chapple-Sokol , et al. September 9, 1
1997-09-09
Contactless real-time in-situ monitoring of a chemical etching
Grant 5,516,399 - Balconi-Lamica , et al. May 14, 1
1996-05-14

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