loadpatents
name:-0.0093238353729248
name:-0.0083239078521729
name:-0.00079607963562012
Wolf; Stephan H. Patent Filings

Wolf; Stephan H.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wolf; Stephan H..The latest application filed is for "endpoint detection system for wafer polishing".

Company Profile
0.7.7
  • Wolf; Stephan H. - Los Osos CA
  • Wolf; Stephan H - Los Osos CA
  • Wolf; Stephan H. - San Luis Obispo CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Endpoint detection system for wafer polishing
Grant 7,918,712 - Wolf April 5, 2
2011-04-05
Endpoint Detection System For Wafer Polishing
App 20100144244 - Wolf; Stephan H.
2010-06-10
Endpoint detection system for wafer polishing
App 20090061734 - Wolf; Stephan H.
2009-03-05
Endpoint detection system for wafer polishing
Grant 7,195,541 - Wolf March 27, 2
2007-03-27
Endpoint detection system for wafer polishing
App 20060217038 - Wolf; Stephan H.
2006-09-28
Optical coupler hub for chemical-mechanical-planarization polishing pads with an integrated optical waveguide
Grant 7,074,110 - Wolf July 11, 2
2006-07-11
Endpoint detection system for wafer polishing
Grant 7,052,366 - Wolf May 30, 2
2006-05-30
Endpoint detection system for wafer polishing
App 20040229545 - Wolf, Stephan H.
2004-11-18
Fiber optical sensor embedded into the polishing pad for in-situ, real-time, monitoring of thin films during the chemical mechanical planarization process
Grant 6,780,085 - Wolf August 24, 2
2004-08-24
Endpoint detection system for wafer polishing
Grant 6,695,681 - Wolf February 24, 2
2004-02-24
Optical coupler hub for chemical-mechanical-planarization polishing pads with an integrated optical waveguide.
App 20030190866 - Wolf, Stephan H.
2003-10-09
Endpoint detection system for wafer polishing
App 20030109196 - Wolf, Stephan H.
2003-06-12
Fiber optical sensor embedded into the polishing pad for in-situ, real-time, monitoring of thin films during the chemical mechanical planarization process
App 20030100243 - Wolf, Stephan H.
2003-05-29
Optical view port for chemical mechanical planarization endpoint detection
Grant 6,146,242 - Treur , et al. November 14, 2
2000-11-14

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