loadpatents
Patent applications and USPTO patent grants for Withers; Bradley S..The latest application filed is for "brush mandrel for pva sponge brush".
Patent | Date |
---|---|
Brush mandrel for PVA sponge brush Grant 9,455,163 - Willis , et al. September 27, 2 | 2016-09-27 |
Conical sponge brush for cleaning semiconductor wafers Grant 9,237,797 - Tyrrell , et al. January 19, 2 | 2016-01-19 |
Brush with cantilevered nodules Grant 9,202,723 - Withers , et al. December 1, 2 | 2015-12-01 |
Brush core for a sponge brush Grant D727,579 - Willis , et al. April 21, 2 | 2015-04-21 |
Brush Mandrel For Pva Sponge Brush App 20140373874 - Willis; Robert ;   et al. | 2014-12-25 |
Brush mandrel for PVA sponge brush Grant 8,898,845 - Willis , et al. December 2, 2 | 2014-12-02 |
Conical Sponge Brush For Cleaning Semiconductor Wafers App 20140283320 - Tyrrell; Jeffrey J. ;   et al. | 2014-09-25 |
Conical sponge brush for cleaning semiconductor wafers Grant 8,778,087 - Tyrrell , et al. July 15, 2 | 2014-07-15 |
Concave Nodule Sponge Brush App 20130255721 - Tyrrell; Jeffrey J. ;   et al. | 2013-10-03 |
Conical Sponge Brush For Cleaning Semiconductor Wafers App 20130255720 - Tyrrell; Jeffrey J. ;   et al. | 2013-10-03 |
Brush With Cantilevered Nodules App 20130133692 - Withers; Bradley S. ;   et al. | 2013-05-30 |
Brush Mandrel For Pva Sponge Brush App 20120312322 - Willis; Robert ;   et al. | 2012-12-13 |
Metal capping of damascene structures to improve reliability using hyper selective chemical-mechanical deposition Grant 7,795,150 - Chan , et al. September 14, 2 | 2010-09-14 |
CMP wafer contamination reduced by insitu clean Grant 7,344,989 - Withers , et al. March 18, 2 | 2008-03-18 |
CMP wafer contamination reduced by insitu clean App 20070039927 - Withers; Bradley S. ;   et al. | 2007-02-22 |
Metal capping of damascene structures to improve reliability using hyper selective chemical-mechanical deposition App 20060115976 - Chan; Elvis M. ;   et al. | 2006-06-01 |
Multiport polishing fluid delivery system App 20030027505 - Withers, Bradley S. ;   et al. | 2003-02-06 |
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