loadpatents
name:-0.010196924209595
name:-0.0094130039215088
name:-0.0014309883117676
Withers; Bradley S. Patent Filings

Withers; Bradley S.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Withers; Bradley S..The latest application filed is for "brush mandrel for pva sponge brush".

Company Profile
0.11.10
  • Withers; Bradley S. - El Dorado Hills CA
  • Withers; Bradley S. - Folsom CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Brush mandrel for PVA sponge brush
Grant 9,455,163 - Willis , et al. September 27, 2
2016-09-27
Conical sponge brush for cleaning semiconductor wafers
Grant 9,237,797 - Tyrrell , et al. January 19, 2
2016-01-19
Brush with cantilevered nodules
Grant 9,202,723 - Withers , et al. December 1, 2
2015-12-01
Brush core for a sponge brush
Grant D727,579 - Willis , et al. April 21, 2
2015-04-21
Brush Mandrel For Pva Sponge Brush
App 20140373874 - Willis; Robert ;   et al.
2014-12-25
Brush mandrel for PVA sponge brush
Grant 8,898,845 - Willis , et al. December 2, 2
2014-12-02
Conical Sponge Brush For Cleaning Semiconductor Wafers
App 20140283320 - Tyrrell; Jeffrey J. ;   et al.
2014-09-25
Conical sponge brush for cleaning semiconductor wafers
Grant 8,778,087 - Tyrrell , et al. July 15, 2
2014-07-15
Concave Nodule Sponge Brush
App 20130255721 - Tyrrell; Jeffrey J. ;   et al.
2013-10-03
Conical Sponge Brush For Cleaning Semiconductor Wafers
App 20130255720 - Tyrrell; Jeffrey J. ;   et al.
2013-10-03
Brush With Cantilevered Nodules
App 20130133692 - Withers; Bradley S. ;   et al.
2013-05-30
Brush Mandrel For Pva Sponge Brush
App 20120312322 - Willis; Robert ;   et al.
2012-12-13
Metal capping of damascene structures to improve reliability using hyper selective chemical-mechanical deposition
Grant 7,795,150 - Chan , et al. September 14, 2
2010-09-14
CMP wafer contamination reduced by insitu clean
Grant 7,344,989 - Withers , et al. March 18, 2
2008-03-18
CMP wafer contamination reduced by insitu clean
App 20070039927 - Withers; Bradley S. ;   et al.
2007-02-22
Metal capping of damascene structures to improve reliability using hyper selective chemical-mechanical deposition
App 20060115976 - Chan; Elvis M. ;   et al.
2006-06-01
Multiport polishing fluid delivery system
App 20030027505 - Withers, Bradley S. ;   et al.
2003-02-06

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