Wintest Corporation

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wintest Corporation.The latest application filed is for "inspection method and inspection device for display device and active matrix substrate used for display device".

Company Profile

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Wintest Corporation - JP JP
WINTEST CORPORATION - Yokohama-shi JP
Wintest Corporation - Yokohama JP
Wintest Corporation -

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection method and inspection device for display device and active matrix substrate used for display device Grant 7,199,602 - Nara , et al. April 3, 2	2007-04-03
Tester device, inspection device, and interconnection board receiving unit for the tester device and inspection device Grant 7,154,261 - Nagamine , et al. December 26, 2	2006-12-26
Inspection method and inspection device for display device and active matrix substrate used for display device App 20060255827 - Nara; Shoji ; et al.	2006-11-16
Apparatus and method for inspecting picture elements of an active matrix type display board Grant 6,891,532 - Nara , et al. May 10, 2	2005-05-10
Method and device for inspection active matrix substrate Grant 6,847,223 - Nara , et al. January 25, 2	2005-01-25
Inspection method and inspection device for active matrix substrate, inspection program used therefor, and information storage medium Grant 6,815,975 - Nara , et al. November 9, 2	2004-11-09
Apparatus and method for evaluating organic EL display Grant 6,633,135 - Nara , et al. October 14, 2	2003-10-14
Apparatus and method for inspecting picture elements of active matrix type display App 20020154108 - Nara, Shouji ; et al.	2002-10-24
Apparatus and method for evaluating organic EL display App 20020047565 - Nara, Shouji ; et al.	2002-04-25

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