Wilson; Lester
Patent Applications and Registrations
Patent applications and USPTO patent grants for Wilson; Lester.The latest application filed is for "fixation systems and methods of repairing a pars fracture".
- Wilson; Lester - Middlesex GB
- Wilson, Lester - Sherman TX
| Patent | Date |
|---|---|
| Fixation Systems And Methods Of Repairing A Pars Fracture App 20210386460 - Wilson; Lester ; et al. | 2021-12-16 |
| Fixation systems and methods of repairing a pars fracture Grant 11,109,898 - Wilson , et al. September 7, 2 | 2021-09-07 |
| Spinal Implant App 20200237526 - Wilson; Lester ; et al. | 2020-07-30 |
| Spinal implant Grant 10,660,763 - Wilson , et al. | 2020-05-26 |
| Fixation Systems And Methods Of Repairing A Pars Fracture App 20180353222 - Wilson; Lester ; et al. | 2018-12-13 |
| Spinal implant Grant D824,518 - Wilson , et al. July 31, 2 | 2018-07-31 |
| Spinal Implant App 20160213487 - Wilson; Lester ; et al. | 2016-07-28 |
| High density, area array probe card apparatus App 20050140382 - Wilson, Lester ; et al. | 2005-06-30 |
| High density, area array probe card apparatus Grant 6,906,539 - Wilson , et al. June 14, 2 | 2005-06-14 |
| High density probe card apparatus and method of manufacture App 20040169521 - Rincon, Reynaldo M. ; et al. | 2004-09-02 |
| High density probe card apparatus and method of manufacture Grant 6,720,780 - Rincon , et al. April 13, 2 | 2004-04-13 |
| Probe card with contact apparatus and method of manufacture Grant 6,636,063 - Arnold , et al. October 21, 2 | 2003-10-21 |
| Low cost area array probe for circuits having solder-ball contacts are manufactured using a wire bonding machine App 20030116346 - Forster, James Allam ; et al. | 2003-06-26 |
| Dual plane probe card assembly and method of manufacture App 20030094962 - Rincon, Reynaldo M. ; et al. | 2003-05-22 |
| Semiconductor test structure having a laser defined current carrying structure App 20030088975 - Arnold, Richard W. ; et al. | 2003-05-15 |
| Probe card with contact apparatus and method of manufacture App 20030062915 - Arnold, Richard W. ; et al. | 2003-04-03 |
| Semiconductor test structure having a laser defined current carrying structure App 20020084799 - Arnold, Richard W. ; et al. | 2002-07-04 |
| High density probe card apparatus and method of manufacture App 20020027443 - Rincon, Reynaldo M. ; et al. | 2002-03-07 |
| High density, area array probe card apparatus App 20020008529 - Wilson, Lester ; et al. | 2002-01-24 |
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