loadpatents
name:-0.016868114471436
name:-0.012256145477295
name:-0.00050616264343262
Wilsher; Kenneth R. Patent Filings

Wilsher; Kenneth R.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wilsher; Kenneth R..The latest application filed is for "pica system timing measurement and calibration".

Company Profile
0.12.10
  • Wilsher; Kenneth R. - Palo Alto CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
PICA system timing measurement and calibration
Grant 7,228,464 - Wilsher June 5, 2
2007-06-05
Superconducting single photon detector
Grant 7,049,593 - Sobolewski , et al. May 23, 2
2006-05-23
Optical coupling for testing integrated circuits
Grant 7,042,563 - Wilsher , et al. May 9, 2
2006-05-09
Optical coupling for testing integrated circuits
Grant 6,985,219 - Wilsher , et al. January 10, 2
2006-01-10
Spatial and temporal selective laser assisted fault localization
Grant 6,967,491 - Perdu , et al. November 22, 2
2005-11-22
PICA system timing measurement and calibration
App 20050160331 - Wilsher, Kenneth R.
2005-07-21
Optical coupling for testing integrated circuits
App 20050128471 - Wilsher, Kenneth R. ;   et al.
2005-06-16
Precise, in-situ endpoint detection for charged particle beam processing
Grant 6,905,623 - Lundquist , et al. June 14, 2
2005-06-14
Precise, in-situ endpoint detection for charged particle beam processing
App 20050109956 - Lundquist, Theodore R. ;   et al.
2005-05-26
Superconducting single photon detector
App 20050051726 - Sobolewski, Roman ;   et al.
2005-03-10
Spatial and temporal selective laser assisted fault localization
App 20050006602 - Perdu, Philippe ;   et al.
2005-01-13
PICA system timing measurement & calibration
Grant 6,819,117 - Wilsher November 16, 2
2004-11-16
Superconducting single photon detector
Grant 6,812,464 - Sobolewski , et al. November 2, 2
2004-11-02
Photoconductive-sampling voltage measurement
Grant 6,737,853 - Wilsher , et al. May 18, 2
2004-05-18
PICA system timing measurement & calibration
App 20030141879 - Wilsher, Kenneth R.
2003-07-31
Precise, in-situ endpoint detection for charged particle beam processing
App 20030132196 - Lundquist, Theodore R. ;   et al.
2003-07-17
Photoconductive-sampling voltage measurement
App 20030076122 - Wilsher, Kenneth R. ;   et al.
2003-04-24
On-chip optically triggered latch for IC time measurements
Grant 6,501,288 - Wilsher December 31, 2
2002-12-31
Optical coupling for testing integrated circuits
App 20020113958 - Wilsher, Kenneth R. ;   et al.
2002-08-22
Precise, in-situ endpoint detection for charged particle beam processing
App 20020074494 - Lundquist, Theodore R. ;   et al.
2002-06-20
Method and circuit for controlling voltage reflections on transmission lines
Grant 5,287,022 - Wilsher February 15, 1
1994-02-15
Pulsed laser photoemission electron-beam probe
Grant 5,270,643 - Richardson , et al. December 14, 1
1993-12-14

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