loadpatents
Patent applications and USPTO patent grants for Wilsher; Kenneth R..The latest application filed is for "pica system timing measurement and calibration".
Patent | Date |
---|---|
PICA system timing measurement and calibration Grant 7,228,464 - Wilsher June 5, 2 | 2007-06-05 |
Superconducting single photon detector Grant 7,049,593 - Sobolewski , et al. May 23, 2 | 2006-05-23 |
Optical coupling for testing integrated circuits Grant 7,042,563 - Wilsher , et al. May 9, 2 | 2006-05-09 |
Optical coupling for testing integrated circuits Grant 6,985,219 - Wilsher , et al. January 10, 2 | 2006-01-10 |
Spatial and temporal selective laser assisted fault localization Grant 6,967,491 - Perdu , et al. November 22, 2 | 2005-11-22 |
PICA system timing measurement and calibration App 20050160331 - Wilsher, Kenneth R. | 2005-07-21 |
Optical coupling for testing integrated circuits App 20050128471 - Wilsher, Kenneth R. ;   et al. | 2005-06-16 |
Precise, in-situ endpoint detection for charged particle beam processing Grant 6,905,623 - Lundquist , et al. June 14, 2 | 2005-06-14 |
Precise, in-situ endpoint detection for charged particle beam processing App 20050109956 - Lundquist, Theodore R. ;   et al. | 2005-05-26 |
Superconducting single photon detector App 20050051726 - Sobolewski, Roman ;   et al. | 2005-03-10 |
Spatial and temporal selective laser assisted fault localization App 20050006602 - Perdu, Philippe ;   et al. | 2005-01-13 |
PICA system timing measurement & calibration Grant 6,819,117 - Wilsher November 16, 2 | 2004-11-16 |
Superconducting single photon detector Grant 6,812,464 - Sobolewski , et al. November 2, 2 | 2004-11-02 |
Photoconductive-sampling voltage measurement Grant 6,737,853 - Wilsher , et al. May 18, 2 | 2004-05-18 |
PICA system timing measurement & calibration App 20030141879 - Wilsher, Kenneth R. | 2003-07-31 |
Precise, in-situ endpoint detection for charged particle beam processing App 20030132196 - Lundquist, Theodore R. ;   et al. | 2003-07-17 |
Photoconductive-sampling voltage measurement App 20030076122 - Wilsher, Kenneth R. ;   et al. | 2003-04-24 |
On-chip optically triggered latch for IC time measurements Grant 6,501,288 - Wilsher December 31, 2 | 2002-12-31 |
Optical coupling for testing integrated circuits App 20020113958 - Wilsher, Kenneth R. ;   et al. | 2002-08-22 |
Precise, in-situ endpoint detection for charged particle beam processing App 20020074494 - Lundquist, Theodore R. ;   et al. | 2002-06-20 |
Method and circuit for controlling voltage reflections on transmission lines Grant 5,287,022 - Wilsher February 15, 1 | 1994-02-15 |
Pulsed laser photoemission electron-beam probe Grant 5,270,643 - Richardson , et al. December 14, 1 | 1993-12-14 |
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