Williams; Scott R.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Williams; Scott R..The latest application filed is for "cantilever probe structure for a probe card assembly".
- Williams; Scott R. - Saint George UT
- Williams; Scott R. - St. George UT
- Williams; Scott R. - Beulaville NC
- Williams; Scott R. - Austin TX
- Williams; Scott R. - Farmington UT
- Williams; Scott R. - Mesa AZ
| Patent | Date |
|---|---|
| Probe card with segmented substrate Grant 8,058,889 - Williams November 15, 2 | 2011-11-15 |
| Cantilever probe structure for a probe card assembly Grant 8,004,299 - Williams , et al. August 23, 2 | 2011-08-23 |
| Cantilever Probe Structure For A Probe Card Assembly App 20110148449 - Williams; Scott R. ; et al. | 2011-06-23 |
| Apparatus and method for agricultural animal wastewater treatment Grant 7,951,296 - Williams May 31, 2 | 2011-05-31 |
| Probe card with stacked substrate Grant 7,898,276 - Williams , et al. March 1, 2 | 2011-03-01 |
| Probe card with segmented substrate App 20090212795 - Williams; Scott R. | 2009-08-27 |
| Probe Card With Stacked Substrate App 20080246501 - Williams; Scott R. ; et al. | 2008-10-09 |
| Stacked tip cantilever electrical connector Grant 7,279,917 - Williams , et al. October 9, 2 | 2007-10-09 |
| Methods and systems to detect business disruptions, determine potential causes of those business disruptions, or both App 20070168915 - Fabbio; Robert A. ; et al. | 2007-07-19 |
| Cantilever probe structure for a probe card assembly App 20070089551 - Williams; Scott R. ; et al. | 2007-04-26 |
| Stacked tip cantilever electrical connector App 20060043995 - Williams; Scott R. ; et al. | 2006-03-02 |
| Method and system for application-aware network quality of service App 20050232153 - Bishop, Thomas P. ; et al. | 2005-10-20 |
| Apparatus for sampling drill hole cuttings Grant 6,845,657 - Williams January 25, 2 | 2005-01-25 |
| Apparatus for sampling drill hole cuttings App 20030182997 - Williams, Scott R. | 2003-10-02 |
| Method and apparatus for interfacing between automatic wafer probe machines, automatic testers, and probe cards Grant 6,114,869 - Williams , et al. September 5, 2 | 2000-09-05 |
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