loadpatents
name:-0.0045580863952637
name:-0.0055949687957764
name:-0.0004580020904541
Williams; Kurt E. Patent Filings

Williams; Kurt E.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Williams; Kurt E..The latest application filed is for "charged particle source and operation thereof".

Company Profile
0.4.2
  • Williams; Kurt E. - Seaford NY
  • Williams; Kurt E. - Flushing NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Charged particle source and operation thereof
Grant 7,183,716 - Kanarov , et al. February 27, 2
2007-02-27
High selectivity etching of a lead overlay structure
Grant 6,838,389 - Williams , et al. January 4, 2
2005-01-04
Charged particle source and operation thereof
App 20040163766 - Kanarov, Viktor ;   et al.
2004-08-26
High selectivity etching of a lead overlay structure
App 20040020894 - Williams, Kurt E. ;   et al.
2004-02-05
Method for repetitive ion beam processing with a carbon containing ion beam
Grant 6,464,891 - Druz , et al. October 15, 2
2002-10-15
Reactive ion beam etching method and a thin film head fabricated using the method
Grant 6,238,582 - Williams , et al. May 29, 2
2001-05-29

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