Williams; Clayton C.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Williams; Clayton C..The latest application filed is for "interferometry systems and methods".
- Williams; Clayton C. - Salt Lake City UT
- Williams; Clayton C - Salt Lake City UT
- Williams; Clayton C. - Peekskill NY
- Williams; Clayton C. - Katonah NY
| Patent | Date |
|---|---|
| Interferometry Systems And Methods App 20220003540 - Williams; Clayton C. | 2022-01-06 |
| Interferometry systems and methods Grant 11,162,781 - Williams November 2, 2 | 2021-11-02 |
| Interferometry system and associated methods Grant 11,009,341 - Williams May 18, 2 | 2021-05-18 |
| Interferometry Systems And Methods App 20200096320 - Williams; Clayton C. | 2020-03-26 |
| Interferometry system and associated methods Grant 10,514,250 - Williams Dec | 2019-12-24 |
| Interferometry System And Associated Methods App 20190353474 - Williams; Clayton C. | 2019-11-21 |
| Interferometry system and associated methods Grant 10,422,630 - Williams Sept | 2019-09-24 |
| Interferometry System And Associated Methods App 20190162526 - Williams; Clayton C. | 2019-05-30 |
| Interferometry System And Associated Methods App 20180051980 - Williams; Clayton C. | 2018-02-22 |
| Scanning probe characterization of surfaces Grant 7,420,106 - Williams , et al. September 2, 2 | 2008-09-02 |
| Scanning probe characterization of surfaces App 20060225164 - Williams; Clayton C. ; et al. | 2006-10-05 |
| Scanning tunneling charge transfer microscope Grant 6,583,412 - Williams June 24, 2 | 2003-06-24 |
| Scanning tunneling charge transfer microscope App 20020005481 - Williams, Clayton C. | 2002-01-17 |
| Micromachined probes for nanometer scale measurements and methods of making such probes Grant 5,969,345 - Williams , et al. October 19, 1 | 1999-10-19 |
| Scanning capacitance - voltage microscopy Grant 5,065,103 - Slinkman , et al. November 12, 1 | 1991-11-12 |
| Apertureless near field optical microscope Grant 4,947,034 - Wickramasinghe , et al. August 7, 1 | 1990-08-07 |
| Scanning thermal profiler Grant 4,747,698 - Wickramasinghe , et al. May 31, 1 | 1988-05-31 |
| Method and apparatus for non-destructive testing using acoustic-optic laser probe Grant 4,666,308 - Williams May 19, 1 | 1987-05-19 |
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