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Patent applications and USPTO patent grants for Willenborg; David L..The latest application filed is for "sample characteristic analysis utilizing multi wavelength and multi angle polarization and magnitude change detection".
Patent | Date |
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Sample characteristic analysis utilizing multi wavelength and multi angle polarization and magnitude change detection Grant 5,596,406 - Rosencwaig , et al. January 21, 1 | 1997-01-21 |
Multiple angle spectroscopic analyzer utilizing interferometric and ellipsometric devices Grant 5,412,473 - Rosencwaig , et al. May 2, 1 | 1995-05-02 |
Optical measurement device with enhanced sensitivity Grant 5,159,412 - Willenborg , et al. October 27, 1 | 1992-10-27 |
High resolution ellipsometric apparatus Grant 5,042,951 - Gold , et al. August 27, 1 | 1991-08-27 |
Method and apparatus for measuring thickness of thin films Grant 4,999,014 - Gold , et al. March 12, 1 | 1991-03-12 |
Apparatus for locating and testing areas of interest on a workpiece Grant 4,795,260 - Schuur , et al. January 3, 1 | 1989-01-03 |
Detecting thermal waves to evaluate thermal parameters Grant 4,579,463 - Rosencwaig , et al. April 1, 1 | 1986-04-01 |
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