loadpatents
name:-0.012385129928589
name:-0.014055013656616
name:-0.00046086311340332
Wille; William C. Patent Filings

Wille; William C.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wille; William C..The latest application filed is for "methods of forming integrated circuit devices having ion-cured electrically insulating layers therein".

Company Profile
0.12.10
  • Wille; William C. - Red Hook NY
  • Wille; William C. - Red Hood NY
  • Wille; William C. - Poughkeepsie NY
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Methods of forming integrated circuit devices having ion-cured electrically insulating layers therein
Grant 7,838,390 - Kim , et al. November 23, 2
2010-11-23
Structure and method to form improved isolation in a semiconductor device
Grant 7,635,899 - Yang , et al. December 22, 2
2009-12-22
Stress engineering using dual pad nitride with selective SOI device architecture
Grant 7,550,364 - Chidambarrao , et al. June 23, 2
2009-06-23
Methods of Forming Integrated Circuit Devices Having Ion-Cured Electrically Insulating Layers Therein
App 20090098706 - Kim; Jun-jung ;   et al.
2009-04-16
Semiconductor Etching Methods
App 20090047791 - Dobuzinsky; David M. ;   et al.
2009-02-19
Structure And Method To Form Improved Isolation In A Semiconductor Device
App 20080171420 - Yang; Haining S. ;   et al.
2008-07-17
Semiconductor Structure Including Isolation Region With Variable Linewidth And Method For Fabrication Therof
App 20070293016 - Luo; Zhijiong ;   et al.
2007-12-20
Trench Capacitor Having Lateral Extensions In Only One Direction And Related Methods
App 20070267671 - Cheng; Kangguo ;   et al.
2007-11-22
Stress Engineering Using Dual Pad Nitride With Selective Soi Device Architecture
App 20070122965 - Chidambarrao; Dureseti ;   et al.
2007-05-31
Stress engineering using dual pad nitride with selective SOI device architecture
Grant 7,202,513 - Chidambarrao , et al. April 10, 2
2007-04-10
Stress Engineering Using Dual Pad Nitride With Selective Soi Device Architecture
App 20070069294 - Chidambarrao; Dureseti ;   et al.
2007-03-29
Magnetic random access memory and method of fabricating thereof
Grant 7,183,130 - Nuetzel , et al. February 27, 2
2007-02-27
Method for forming damascene structure utilizing planarizing material coupled with diffusion barrier material
Grant 7,030,031 - Wille , et al. April 18, 2
2006-04-18
Magnetic Random Access Memory And Method Of Fabricating Thereof
App 20050023581 - Nuetzel, Joachim ;   et al.
2005-02-03
Method For Forming Damascene Structure Utilizing Planarizing Material Coupled With Diffusion Barrier Material
App 20040266201 - Wille, William C. ;   et al.
2004-12-30
Micro electromechanical switch having self-aligned spacers
Grant 6,762,667 - Volant , et al. July 13, 2
2004-07-13
Micro electromechanical switch having self-aligned spacers
App 20030210124 - Volant, Richard P. ;   et al.
2003-11-13
Micro electromechanical switch having self-aligned spacers
Grant 6,621,392 - Volant , et al. September 16, 2
2003-09-16
Anisotropic nitride etch process with high selectivity to oxide and photoresist layers in a damascene etch scheme
Grant 6,461,529 - Boyd , et al. October 8, 2
2002-10-08
Field effect transistors with improved implants and method for making such transistors
Grant 6,143,635 - Boyd , et al. November 7, 2
2000-11-07
Method for making field effect transistors having sub-lithographic gates with vertical side walls
Grant 6,040,214 - Boyd , et al. March 21, 2
2000-03-21
Process of etching an oxide layer
Grant 5,811,357 - Armacost , et al. September 22, 1
1998-09-22

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.

© 2024 USPTO.report | Privacy Policy | Resources | RSS Feed of Trademarks | Trademark Filings Twitter Feed