Whitefield; Bruce J.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Whitefield; Bruce J..The latest application filed is for "yield profile manipulator".
- Whitefield; Bruce J. - Camas WA
| Patent | Date |
|---|---|
| Yield profile manipulator Grant 7,930,655 - Desu , et al. April 19, 2 | 2011-04-19 |
| Nanotube fuse structure Grant 7,598,127 - Whitefield , et al. October 6, 2 | 2009-10-06 |
| Yield Profile Manipulator App 20080216048 - Desu; ChandraSekhar ; et al. | 2008-09-04 |
| Yield profile manipulator Grant 7,395,522 - Desu , et al. July 1, 2 | 2008-07-01 |
| Surface coordinate system Grant 7,315,360 - Whitefield , et al. January 1, 2 | 2008-01-01 |
| Pattern detection for integrated circuit substrates Grant 7,277,813 - Whitefield , et al. October 2, 2 | 2007-10-02 |
| Dynamic edge bead removal Grant 7,183,181 - Li , et al. February 27, 2 | 2007-02-27 |
| Nanotube fuse structure App 20060258122 - Whitefield; Bruce J. ; et al. | 2006-11-16 |
| Pattern component analysis and manipulation Grant 7,137,098 - Whitefield , et al. November 14, 2 | 2006-11-14 |
| Pattern detection for integrated circuit substrates App 20060190207 - Whitefield; Bruce J. ; et al. | 2006-08-24 |
| Parametric outlier detection Grant 7,062,415 - Whitefield , et al. June 13, 2 | 2006-06-13 |
| Substrate profile analysis Grant 7,039,556 - Whitefield , et al. May 2, 2 | 2006-05-02 |
| Metal removal from solvent App 20060076036 - Whitefield; Bruce J. ; et al. | 2006-04-13 |
| Dynamic edge bead removal App 20060073703 - Li; Xiao ; et al. | 2006-04-06 |
| Surface coordinate system App 20060073617 - Whitefield; Bruce J. ; et al. | 2006-04-06 |
| Defect monitoring system App 20060069659 - Gatov; Michael S. ; et al. | 2006-03-30 |
| Substrate edge scribe App 20060065985 - Berman; Michael J. ; et al. | 2006-03-30 |
| Pattern component analysis and manipulation App 20060059452 - Whitefield; Bruce J. ; et al. | 2006-03-16 |
| Substrate contact analysis Grant 7,013,192 - Whitefield , et al. March 14, 2 | 2006-03-14 |
| Parametric outlier detection App 20060047485 - Whitefield; Bruce J. ; et al. | 2006-03-02 |
| Substrate profile analysis App 20050288896 - Whitefield, Bruce J. ; et al. | 2005-12-29 |
| Substrate Contact Analysis App 20050278678 - Whitefield, Bruce J. ; et al. | 2005-12-15 |
| Yield profile manipulator App 20050229144 - Desu, Chandra Sekhar ; et al. | 2005-10-13 |
| Key hole filling Grant 6,645,857 - Whitefield , et al. November 11, 2 | 2003-11-11 |
| Process control system Grant 6,512,985 - Whitefield , et al. January 28, 2 | 2003-01-28 |
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