Whitefield; Bruce

Patent Applications and Registrations

Patent applications and USPTO patent grants for Whitefield; Bruce.The latest application filed is for "voltage contrast monitor for integrated circuit defects".

Company Profile

0.17.12

Whitefield; Bruce - Camas WA
Whitefield; Bruce - Menlo Park CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Wafer edge expose alignment method Grant 7,799,166 - Whitefield September 21, 2	2010-09-21
Method for calculating high-resolution wafer parameter profiles Grant 7,653,523 - Whitefield , et al. January 26, 2	2010-01-26
Voltage contrast monitor for integrated circuit defects Grant 7,560,292 - Whitefield July 14, 2	2009-07-14
Apparatus for wafer patterning to reduce edge exclusion zone Grant 7,460,211 - Whitefield , et al. December 2, 2	2008-12-02
Voltage Contrast Monitor For Integrated Circuit Defects App 20080061805 - Whitefield; Bruce	2008-03-13
Voltage contrast monitor for integrated circuit defects Grant 7,323,768 - Whitefield January 29, 2	2008-01-29
Wafer edge structure measurement method Grant 7,312,880 - Whitefield , et al. December 25, 2	2007-12-25
Apparatus For Wafer Patterning To Reduce Edge Exclusion Zone App 20060191634 - Whitefield; Bruce ; et al.	2006-08-31
Method of wafer patterning for reducing edge exclusion zone Grant 7,074,710 - Whitefield , et al. July 11, 2	2006-07-11
Method Of Wafer Patterning For Reducing Edge Exclusion Zone App 20060094246 - Whitefield; Bruce ; et al.	2006-05-04
Wafer edge expose alignment method App 20060060299 - Whitefield; Bruce	2006-03-23
Wafer edge structure measurement method App 20060044571 - Whitefield; Bruce ; et al.	2006-03-02
Method of mapping logic failures in an integrated circuit die Grant 6,986,112 - Whitefield , et al. January 10, 2	2006-01-10
Method and control system for improving CMP process by detecting and reacting to harmonic oscillation Grant 6,971,944 - Berman , et al. December 6, 2	2005-12-06
Voltage contrast monitor for integrated circuit defects App 20050224963 - Whitefield, Bruce	2005-10-13
Method of detecting spatially correlated variations in a parameter of an integrated circuit die Grant 6,943,042 - Madge , et al. September 13, 2	2005-09-13
Voltage contrast monitor for integrated circuit defects Grant 6,936,920 - Whitefield August 30, 2	2005-08-30
Method And Control System For Improving Cmp Process By Detecting And Reacting To Harmonic Oscillation App 20050181706 - Berman, Michael J. ; et al.	2005-08-18
Method for calculating high-resolution wafer parameter profiles App 20050132308 - Whitefield, Bruce ; et al.	2005-06-16
Voltage contrast monitor for integrated circuit defects App 20050046019 - Whitefield, Bruce	2005-03-03
Method of mapping logic failures in an integrated circuit die App 20050028115 - Whitefield, Bruce ; et al.	2005-02-03
Method of detecting spatially correlated variations in a parameter of an integrated circuit die Grant 6,787,379 - Madge , et al. September 7, 2	2004-09-07
Process for inhibiting edge peeling of coating on semiconductor substrate during formation of integrated circuit structure thereon Grant 6,767,692 - Young , et al. July 27, 2	2004-07-27
Method of detecting spatially correlated variations in a parameter of an integrated circuit die App 20040033635 - Madge, Robert ; et al.	2004-02-19
Integrated process tool monitoring system for semiconductor fabrication Grant 6,650,958 - Balazs , et al. November 18, 2	2003-11-18
Apparatus for removing photoresist edge beads from thin film substrates Grant 6,614,507 - Young , et al. September 2, 2	2003-09-02
Apparatus for removing photoresist edge beads from thin film substrates App 20030031959 - Young, Roger Y.B. ; et al.	2003-02-13
Method and apparatus for removing photoresist edge beads from thin film substrates Grant 6,495,312 - Young , et al. December 17, 2	2002-12-17
Method and structure for improving patterning design for processing Grant 5,654,897 - Tripathi , et al. August 5, 1	1997-08-05

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