loadpatents
name:-0.035473108291626
name:-0.032474040985107
name:-0.2092719078064
Weston; Nicholas John Patent Filings

Weston; Nicholas John

Patent Applications and Registrations

Patent applications and USPTO patent grants for Weston; Nicholas John.The latest application filed is for "laser beam scanner".

Company Profile
8.31.28
  • Weston; Nicholas John - Peebles GB
  • - Peebles GB
  • Weston; Nicholas John - Gwent GB
  • Weston, Nicholas John - Chepstow Gwent GB
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Additive manufacturing apparatus and method
Grant 11,123,799 - McMurtry , et al. September 21, 2
2021-09-21
Non-contact probe and method of operation
Grant 11,105,607 - Weston , et al. August 31, 2
2021-08-31
Laser Beam Scanner
App 20210229215 - WESTON; Nicholas John ;   et al.
2021-07-29
Marking Method And System
App 20200233377 - WESTON; Nicholas John ;   et al.
2020-07-23
Additive Manufacturing Apparatus And Method
App 20190329323 - MCMURTRY; David Roberts ;   et al.
2019-10-31
Additive manufacturing apparatus and method
Grant 10,399,145 - McMurtry , et al. Sep
2019-09-03
Non-contact Probe And Method Of Operation
App 20190154430 - WESTON; Nicholas John ;   et al.
2019-05-23
Method of forming an optical device
Grant 10,226,840 - Weston , et al.
2019-03-12
Measurement scale with periodic nanostructure
Grant 9,945,697 - Kidd , et al. April 17, 2
2018-04-17
Optical inspection probe
Grant 9,618,329 - Weston , et al. April 11, 2
2017-04-11
Non-contact probe
Grant RE46,012 - Weston , et al. May 24, 2
2016-05-24
Additive Manufacturing Apparatus And Method
App 20160136730 - MCMURTRY; David Roberts ;   et al.
2016-05-19
Non-contact object inspection
Grant 9,329,030 - Weston , et al. May 3, 2
2016-05-03
Measurement Scale
App 20150369637 - KIDD; Matthew Donald ;   et al.
2015-12-24
Method Of Reading Data
App 20150339505 - KIDD; Matthew Donald ;   et al.
2015-11-26
Probe head for scanning the surface of a workpiece
Grant 8,978,261 - McFarland , et al. March 17, 2
2015-03-17
Calibration artefact for calibrating an articulating probe head
Grant 8,939,008 - McMurtry , et al. January 27, 2
2015-01-27
Non-contact measurement apparatus and method
Grant 8,923,603 - Weston , et al. December 30, 2
2014-12-30
Non-contact measurement apparatus and method
Grant 08923603 -
2014-12-30
Phase analysis measurement apparatus and method
Grant 8,792,707 - Weston , et al. July 29, 2
2014-07-29
Non-contact probe
Grant 8,605,983 - Weston , et al. December 10, 2
2013-12-10
Method Of Forming An Optical Device
App 20130180959 - Weston; Nicholas John ;   et al.
2013-07-18
Articulating probe head apparatus and method
Grant 8,474,148 - Jonas , et al. July 2, 2
2013-07-02
Non-contact Object Inspection
App 20120154576 - Weston; Nicholas John ;   et al.
2012-06-21
Vision Measurement Probe And Method Of Operation
App 20120072170 - McKendrick; Alexander David ;   et al.
2012-03-22
Method for scanning the surface of a workpiece
App 20110283553 - McFarland; Geoffrey ;   et al.
2011-11-24
Method of error compensation in a coordinate measuring machine
App 20110277534 - McMurtry; David Roberts ;   et al.
2011-11-17
Method for scanning the surface of a workpiece
Grant 8,006,398 - McFarland , et al. August 30, 2
2011-08-30
Method of error compensation in a coordinate measuring machine
Grant 8,001,859 - McMurtry , et al. August 23, 2
2011-08-23
Method for scanning the surface of a workpiece
Grant 7,908,759 - McLean , et al. March 22, 2
2011-03-22
Articulating probe head apparatus and method
App 20110061253 - Jonas; Kevyn Barry ;   et al.
2011-03-17
Optical Inspection Probe
App 20110058159 - Weston; Nicholas John ;   et al.
2011-03-10
Contact sensing probe
Grant 7,891,109 - Weston , et al. February 22, 2
2011-02-22
Articulating probe head apparatus and method
Grant 7,861,430 - Jonas , et al. January 4, 2
2011-01-04
Contact sensing probe
Grant 7,856,731 - Weston , et al. December 28, 2
2010-12-28
Phase Analysis Measurement Apparatus And Method
App 20100158322 - Weston; Nicholas John ;   et al.
2010-06-24
Non-contact Measurement Apparatus And Method
App 20100142798 - Weston; Nicholas John ;   et al.
2010-06-10
Non-contact Probe
App 20100135534 - Weston; Nicholas John ;   et al.
2010-06-03
Opto-electronic Read Head
App 20100072456 - Weston; Nicholas John ;   et al.
2010-03-25
Method of error compensation in a coordinate measuring machine
App 20100005852 - McMurtry; David Roberts ;   et al.
2010-01-14
Surface Measurement Probe
App 20090320553 - Weston; Nicholas John ;   et al.
2009-12-31
Method for scanning the surface of a workpiece
App 20090307916 - McLean; Ian William ;   et al.
2009-12-17
Method of error compensation in a coordinate measuring machine
Grant 7,568,373 - McMurtry , et al. August 4, 2
2009-08-04
Contact Sensing Probe
App 20090165318 - Weston; Nicholas John ;   et al.
2009-07-02
Contact Sensing Probe
App 20090100693 - Weston; Nicholas John ;   et al.
2009-04-23
Articulating Probe Head Apparatus and Method
App 20090025244 - Jonas; Kevyn Barry ;   et al.
2009-01-29
Method for Scanning the Surface of a Workpiece
App 20090025463 - McFarland; Geoffrey ;   et al.
2009-01-29
Reaction balanced rotary drive mechanism
Grant 7,456,538 - Nai , et al. November 25, 2
2008-11-25
Method of error compensation in a coordinate measuring machine
App 20060266100 - McMurtry; David Roberts ;   et al.
2006-11-30
Reaction balanced rotary drive mechanism
App 20050067908 - Nai, Kenneth Cheng-Hoe ;   et al.
2005-03-31

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