Wertsman; Nadav

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wertsman; Nadav.The latest application filed is for "method and apparatus for correcting errors on a wafer processed by a photolithographic mask".

Company Profile

0.6.6

Wertsman; Nadav - Ein Hod IL
Wertsman; Nadav - Jerusalem IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for correcting errors on a wafer processed by a photolithographic mask Grant 10,061,192 - Beyer , et al. August 28, 2	2018-08-28
Method And Apparatus For Correcting Errors On A Wafer Processed By A Photolithographic Mask App 20160342080 - Beyer; Dirk ; et al.	2016-11-24
Method and apparatus for correcting errors on a wafer processed by a photolithographic mask Grant 9,436,080 - Beyer , et al. September 6, 2	2016-09-06
Process control and manufacturing method for fan out wafers Grant 8,836,780 - Weiss , et al. September 16, 2	2014-09-16
Method And Apparatus For Correcting Errors On A Wafer Processed By A Photolithographic Mask App 20140036243 - Beyer; Dirk ; et al.	2014-02-06
Process Control And Manufacturing Method For Fan Out Wafers App 20110249111 - Weiss; Tommy ; et al.	2011-10-13
Method And System For Detecting Critical Defects App 20090273669 - WERTSMAN; Nadav ; et al.	2009-11-05
Method for calibrating a metrology tool and a system Grant 7,317,523 - Wertsman , et al. January 8, 2	2008-01-08
Method for calibrating a metrology tool and a system App 20060187447 - Wertsman; Nadav ; et al.	2006-08-24

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