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name:-0.007375955581665
name:-0.0053310394287109
name:-0.0013258457183838
Weng; Wen-Yin Patent Filings

Weng; Wen-Yin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Weng; Wen-Yin.The latest application filed is for "method of forming fin shape structure".

Company Profile
1.5.6
  • Weng; Wen-Yin - Taichung TW
  • Weng; Wen-Yin - Taichung City TW
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method of forming fin shape structure having different buffer layers
Grant 10,312,235 - Weng , et al.
2019-06-04
Method Of Forming Fin Shape Structure
App 20180166444 - Weng; Wen-Yin ;   et al.
2018-06-14
Fin shape structure
Grant 9,929,154 - Weng , et al. March 27, 2
2018-03-27
Method for fabricating substrate of semiconductor device including epitaxial layer and silicon layer having same crystalline orientation
Grant 9,793,296 - Weng , et al. October 17, 2
2017-10-17
Method For Fabricating Substrate Of Semiconductor Device Including Epitaxial Layer And Silicon Layer Having Same Crystalline Orientation
App 20170040346 - Weng; Wen-Yin ;   et al.
2017-02-09
Substrate of semiconductor device including epitaxial layer and silicon layer having same crystalline orientation
Grant 9,508,799 - Weng , et al. November 29, 2
2016-11-29
Fin Shape Structure
App 20160141288 - Weng; Wen-Yin ;   et al.
2016-05-19
PFET and CMOS containing same
Grant 9,299,839 - Weng , et al. March 29, 2
2016-03-29
Substrate Of Semiconductor Device Including Epitaxal Layer And Silicon Layer Having Same Crstalline Orientation
App 20160064485 - Weng; Wen-Yin ;   et al.
2016-03-03
Pfet And Cmos Containing Same
App 20160064563 - WENG; WEN-YIN ;   et al.
2016-03-03
Method of characterizing a device
App 20160003888 - Weng; Wen-Yin ;   et al.
2016-01-07

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