loadpatents
name:-0.022642850875854
name:-0.015363216400146
name:-0.0010871887207031
Wendel; Martin Patent Filings

Wendel; Martin

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wendel; Martin.The latest application filed is for "avalanche diode having an enhanced defect concentration level and method of making the same".

Company Profile
0.15.15
  • Wendel; Martin - Hohenbrunn DE
  • Wendel; Martin - Munchen DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Avalanche diode having an enhanced defect concentration level and method of making the same
Grant 10,756,081 - Schneider , et al. A
2020-08-25
Avalanche Diode Having an Enhanced Defect Concentration Level and Method of Making the Same
App 20180033783 - Schneider; Jens ;   et al.
2018-02-01
Avalanche diode having an enhanced defect concentration level and method of making the same
Grant 9,812,438 - Schneider , et al. November 7, 2
2017-11-07
Avalanche Diode Having an Enhanced Defect Concentration Level and Method of Making the Same
App 20160111413 - Schneider; Jens ;   et al.
2016-04-21
Avalanche diode having an enhanced defect concentration level and method of making the same
Grant 9,257,523 - Schneider , et al. February 9, 2
2016-02-09
Avalanche Diode Having an Enhanced Defect Concentration Level and Method of Making the Same
App 20140291808 - Schneider; Jens ;   et al.
2014-10-02
Avalanche diode having an enhanced defect concentration level and method of making the same
Grant 8,791,547 - Schneider , et al. July 29, 2
2014-07-29
Electronic component and a system and method for producing an electronic component
Grant 8,710,590 - Riess , et al. April 29, 2
2014-04-29
Methods of use and formation of a lateral bipolar transistor with counter-doped implant regions under collector and/or emitter regions
Grant 8,043,934 - Schneider , et al. October 25, 2
2011-10-25
Lateral Bipolar Transistor with Additional ESD Implant
App 20110038085 - Schneider; Jens ;   et al.
2011-02-17
Lateral bipolar transistor with additional ESD implant
Grant 7,875,933 - Schneider , et al. January 25, 2
2011-01-25
ESD protection device and method
Grant 7,709,896 - Russ , et al. May 4, 2
2010-05-04
ESD/EOS Performance by Introduction of Defects
App 20090185316 - Schneider; Jens ;   et al.
2009-07-23
Circuit for protecting integrated circuits against electrostatic discharges
Grant 7,359,169 - Esmark , et al. April 15, 2
2008-04-15
ESD protection device and method
App 20070210387 - Russ; Cornelius Christian ;   et al.
2007-09-13
Electronic component and a system and method for producing an electronic component
App 20070010077 - Riess; Philipp ;   et al.
2007-01-11
Lateral bipolar transistor with additional ESD implant
App 20060226488 - Schneider; Jens ;   et al.
2006-10-12
ESD protective circuit with collector-current-controlled triggering for a monolithically integrated circuit
Grant 7,087,938 - Streibl , et al. August 8, 2
2006-08-08
Circuit for protecting integrated circuits against electrostatic discharges
App 20060056121 - Esmark; Kai ;   et al.
2006-03-16
Method and device for testing the ESD resistance of a semiconductor component
Grant 7,009,404 - Wendel , et al. March 7, 2
2006-03-07
Transistor comprising fill areas in the source drain and/or drain region
App 20050263817 - Wendel, Martin ;   et al.
2005-12-01
ESD protective circuit with collector-current-controlled triggering for a monolithically integrated circuit
App 20050195540 - Streibl, Martin ;   et al.
2005-09-08
Method for determining an ESD/latch-up strength of an integrated circuit
Grant 6,930,501 - Bargstadt-Franke , et al. August 16, 2
2005-08-16
Operating method for a semiconductor component
Grant 6,905,892 - Esmark , et al. June 14, 2
2005-06-14
Method for determining an ESD/latch-up strength of an integrated circuit
App 20050003564 - Bargstadt-Franke, Silke ;   et al.
2005-01-06
Operating method for a semiconductor component
App 20030017676 - Esmark, Kai ;   et al.
2003-01-23
Method and device for testing the ESD resistance of a semiconductor component
App 20030006776 - Wendel, Martin ;   et al.
2003-01-09
Transistor with ESD protection
App 20020093102 - Wendel, Martin ;   et al.
2002-07-18

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