Patent applications and USPTO patent grants for Wells; Keith.The latest application filed is for "defect classification and source analysis for semiconductor equipment".
Patent | Date |
---|---|
Defect Classification And Source Analysis For Semiconductor Equipment App 20220270237 - Sawlani; Kapil ;   et al. | 2022-08-25 |
Defect classification and source analysis for semiconductor equipment Grant 11,263,737 - Sawlani , et al. March 1, 2 | 2022-03-01 |
Atomic Layer Etch And Deposition Processing Systems Including A Lens Circuit With A Tele-centric Lens, An Optical Beam Folding Assembly, Or A Polygon Scanner App 20210143032 - PAENG; Dong Woo ;   et al. | 2021-05-13 |
Defect Classification And Source Analysis For Semiconductor Equipment App 20200226742 - Sawlani; Kapil ;   et al. | 2020-07-16 |
Generating high resolution images from low resolution images for semiconductor applications Grant 10,648,924 - Zhang , et al. | 2020-05-12 |
Optical die to database inspection Grant 10,012,599 - Wells , et al. July 3, 2 | 2018-07-03 |
Optical die to database inspection Grant 9,915,625 - Gao , et al. March 13, 2 | 2018-03-13 |
Hybrid inspectors Grant 9,916,965 - Bhaskar , et al. March 13, 2 | 2018-03-13 |
Mobile energy generator Grant 9,847,695 - Wells , et al. December 19, 2 | 2017-12-19 |
Hybrid Inspectors App 20170194126 - Bhaskar; Kris ;   et al. | 2017-07-06 |
Optical Die to Database Inspection App 20170191948 - Gao; Lisheng ;   et al. | 2017-07-06 |
Generating High Resolution Images From Low Resolution Images For Semiconductor Applications App 20170193680 - Zhang; Jing ;   et al. | 2017-07-06 |
Mobile Energy Generator App 20170047815 - Wells; Keith ;   et al. | 2017-02-16 |
Optical Die to Database Inspection App 20160290934 - Wells; Keith ;   et al. | 2016-10-06 |
Diagnostic Sample Collection System And Method Of Use App 20090301480 - Elsakka; Mamdouh ;   et al. | 2009-12-10 |
Bronchoalveolar Lavage Catheter Assembly App 20090306545 - Elsakka; Mamdouh ;   et al. | 2009-12-10 |
Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection Grant 6,922,236 - Vaez-Iravani , et al. July 26, 2 | 2005-07-26 |
Surgical instrument light source and surgical illumination method Grant 6,585,727 - Cashman , et al. July 1, 2 | 2003-07-01 |
Systems and methods for simultaneous or sequential multi-perspective specimen defect inspection App 20030011760 - Vaez-Iravani, Mehdi ;   et al. | 2003-01-16 |
Illuminated rectal retractor Grant 6,497,654 - Leonard , et al. December 24, 2 | 2002-12-24 |
Illuminated rectal retractor Grant 6,428,473 - Leonard , et al. August 6, 2 | 2002-08-06 |
Particle detection system employing a subsystem for collecting scattered light from the particles Grant 5,604,585 - Johnson , et al. February 18, 1 | 1997-02-18 |
NCAGE Code | 4C1A7 | WELLS KEITH!DBA BIOLIGICS CONSULTING GROUP |
CAGE Code | 4C1A7 | WELLS, KEITH BIOLIGICS CONSULTING GROUP |
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