Weldon; Matthew

Patent Applications and Registrations

Patent applications and USPTO patent grants for Weldon; Matthew.The latest application filed is for "automated calibration methodology for vuv metrology system".

Company Profile

0.6.6

Weldon; Matthew - Austin TX
Weldon; Matthew - Phoenix AZ

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Automated calibration methodology for VUV metrology system Grant 8,153,987 - Hurst , et al. April 10, 2	2012-04-10
Automated calibration methodology for VUV metrology system App 20100294922 - HURST; JEFFREY B. ; et al.	2010-11-25
Contamination monitoring and control techniques for use with an optical metrology instrument Grant 7,663,747 - Harrison , et al. February 16, 2	2010-02-16
Contamination Monitoring And Control Techniques For Use With An Optical Metrology Instrument App 20100000569 - Harrison; Dale A. ; et al.	2010-01-07
Contamination monitoring and control techniques for use with an optical metrology instrument Grant 7,622,310 - Harrison , et al. November 24, 2	2009-11-24
Contamination monitoring and control techniques for use with an optical metrology instrument App 20080073560 - Harrison; Dale A. ; et al.	2008-03-27
Contamination monitoring and control techniques for use with an optical metrology instrument Grant 7,342,235 - Harrison , et al. March 11, 2	2008-03-11
Multiprobe detection system for chemical-mechanical planarization tool Grant 6,960,115 - Weldon , et al. November 1, 2	2005-11-01
Multiprobe detection system for chemical-mechanical planarization tool Grant 6,805,613 - Weldon , et al. October 19, 2	2004-10-19
Multiprobe detection system for chemical-mechanical planarization tool App 20040038624 - Weldon, Matthew ; et al.	2004-02-26
Method and apparatus for monitoring changes in the surface of a workpiece during processing App 20030045008 - Olsen, Gregory ; et al.	2003-03-06
System and method for predicting software models using material-centric process instrumentation App 20010039462 - Mendez, Rafael ; et al.	2001-11-08

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