WEINGARTEN; Amit
Patent Applications and Registrations
Patent applications and USPTO patent grants for WEINGARTEN; Amit.The latest application filed is for "mass spectrometer detector and system and method using the same".
- WEINGARTEN; Amit - Ramat Gan IL
| Patent | Date |
|---|---|
| Mass Spectrometer Detector And System And Method Using The Same App 20220223395 - BEVIS; Christopher F. ; et al. | 2022-07-14 |
| Mass spectrometer detector and system and method using the same Grant 11,183,377 - Bevis , et al. November 23, 2 | 2021-11-23 |
| Particle detection assembly, system and method Grant 10,910,193 - Cheifetz , et al. February 2, 2 | 2021-02-02 |
| Mass Spectrometer Detector And System And Method Using The Same App 20200066502 - BEVIS; Christopher F. ; et al. | 2020-02-27 |
| Particle Detection Assembly, System And Method App 20190259571 - CHEIFETZ; ELI ; et al. | 2019-08-22 |
| Detection assembly, system and method Grant 10,236,155 - Cheifetz , et al. | 2019-03-19 |
| Detection Assembly, System And Method App 20170069459 - CHEIFETZ; ELI ; et al. | 2017-03-09 |
| Electron Detection System App 20160086765 - CHEIFETZ; ELI ; et al. | 2016-03-24 |
| Position sensitive STEM detector Grant 9,076,632 - Reinhorn , et al. July 7, 2 | 2015-07-07 |
| Position Sensitive Stem Detector App 20150034822 - Reinhorn; Silviu ; et al. | 2015-02-05 |
| Method and system for monitoring a process of material removal from the surface of a patterned structure Grant 6,885,446 - Machavariani , et al. April 26, 2 | 2005-04-26 |
| Test structure for metal CMP process control Grant 6,654,108 - Ravid , et al. November 25, 2 | 2003-11-25 |
| Method and system for monitoring a process of material removal from the surface of a patterned structure App 20030155537 - Machavariani, Vladimir ; et al. | 2003-08-21 |
| Test structure for metal CMP process control App 20010026364 - Ravid, Avi ; et al. | 2001-10-04 |
| Test structure for metal CMP process control App 20010015811 - Ravid, Avi ; et al. | 2001-08-23 |
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