Weiland; Larg H.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Weiland; Larg H..The latest application filed is for "system and method for product yield prediction".

Company Profile

0.12.10

Weiland; Larg H. - San Ramon CA
Weiland; Larg. H. - Livermore CA
Weiland, Larg H. - Livermoor CA
Weiland, Larg H - Livermore CA
Weiland, Larg H. - Limomore CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method for product yield prediction Grant 7,673,262 - Stine , et al. March 2, 2	2010-03-02
System And Method For Product Yield Prediction App 20080282210 - Stine; Brian E. ; et al.	2008-11-13
Method for improving mask layout and fabrication Grant 7,434,197 - Dolainsky , et al. October 7, 2	2008-10-07
System and method for product yield prediction Grant 7,373,625 - Stine , et al. May 13, 2	2008-05-13
System and method for product yield prediction Grant 7,356,800 - Stine , et al. April 8, 2	2008-04-08
Layout compiler App 20070268731 - Weiland; Larg H. ; et al.	2007-11-22
System and method for product yield prediction App 20070118242 - Stine; Brian E. ; et al.	2007-05-24
Test structures for estimating dishing and erosion effects in copper damascene technology Grant 7,197,726 - Ciplickas , et al. March 27, 2	2007-03-27
System and method for product yield prediction Grant 7,174,521 - Stine , et al. February 6, 2	2007-02-06
Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure Grant 7,154,115 - Stine , et al. December 26, 2	2006-12-26
System and method for product yield prediction App 20060277506 - Stine; Brian E. ; et al.	2006-12-07
Extraction method of defect density and size distributions Grant 7,024,642 - Hess , et al. April 4, 2	2006-04-04
System and method for product yield prediction App 20050158888 - Stine, Brian E. ; et al.	2005-07-21
Zoom in pin nest structure, test vehicle having the structure, and method of fabricating the structure App 20050122123 - Stine, Brian E. ; et al.	2005-06-09
System and method for product yield prediction Grant 6,901,564 - Stine , et al. May 31, 2	2005-05-31
System and method for product yield prediction using a logic characterization vehicle Grant 6,834,375 - Stine , et al. December 21, 2	2004-12-21
Test structures for estimating dishing and erosion effects in copper damascene technology App 20040232910 - Ciplickas, Dennis J ; et al.	2004-11-25
Test vehicle with zig-zag structures Grant 6,787,800 - Weiland , et al. September 7, 2	2004-09-07
Extraction method of defect density and size distributions App 20040094762 - Hess, Christopher ; et al.	2004-05-20
System and method for product yield prediction App 20030145292 - Stine, Brian E. ; et al.	2003-07-31
Test vehicle with zig-zag structures App 20030020503 - Weiland, Larg H. ; et al.	2003-01-30
Passive multiplexor test structure for integrated circuit manufacturing Grant 6,475,871 - Stine , et al. November 5, 2	2002-11-05

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