Weigand; Peter

Patent Applications and Registrations

Patent applications and USPTO patent grants for Weigand; Peter.The latest application filed is for "user feedback for real-time checking and improving quality of scanned image".

Company Profile

3.13.4

Weigand; Peter - Zurich CH
Weigand; Peter - Bad Vilbel DE
Weigand; Peter - North Croton on Hudson NY
WEIGAND, PETER - HUDSON NY
Weigand; Peter - Unterhaching DE
Weigand; Peter - Croton on Hudson NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
User Feedback For Real-time Checking And Improving Quality Of Scanned Image App 20210144353 - Ilic; Alexander ; et al.	2021-05-13
User feedback for real-time checking and improving quality of scanned image Grant 10,841,551 - Ilic , et al. November 17, 2	2020-11-17
User Feedback For Real-time Checking And Improving Quality Of Scanned Image App 20190342533 - Ilic; Alexander ; et al.	2019-11-07
User feedback for real-time checking and improving quality of scanned image Grant 10,298,898 - Ilic , et al.	2019-05-21
Port arrangement for an internal component Grant 9,758,291 - Weigand , et al. September 12, 2	2017-09-12
Support Arrangement For An Inner Component App 20120234841 - Weigand; Peter ; et al.	2012-09-20
Semiconductor workpiece processing apparatus and method Grant 6,406,545 - Shoda , et al. June 18, 2	2002-06-18
Semiconductor Workpiece Processing Apparatus And Method App 20010008172 - SHODA, NAOHIRO ; et al.	2001-07-19
Vertical electrical cavity-fuse Grant 6,252,292 - Brintzinger , et al. June 26, 2	2001-06-26
Method of manufacturing a shallow trench isolation structure for a semiconductor device Grant 6,150,072 - Shoda , et al. November 21, 2	2000-11-21
Metal line deposition process Grant 6,136,709 - Schmidbauer , et al. October 24, 2	2000-10-24
Metalization system having an enhanced thermal conductivity Grant 6,046,503 - Weigand , et al. April 4, 2	2000-04-04
Multi-level conductive structure including low capacitance material Grant 5,977,635 - Tobben , et al. November 2, 1	1999-11-02
Method of planarizing the semiconductor structure Grant 5,963,837 - Ilg , et al. October 5, 1	1999-10-05
Semiconductor wafer temperature measurement and control thereof using gas temperature measurement Grant 5,937,541 - Weigand , et al. August 17, 1	1999-08-17
Method for forming metallization in semiconductor devices with a self-planarizing material Grant 5,854,126 - Tobben , et al. December 29, 1	1998-12-29

Company Registrations

SEC

0001285676

WEIGAND PETER

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