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name:-0.008469820022583
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Wei; Zhengying Patent Filings

Wei; Zhengying

Patent Applications and Registrations

Patent applications and USPTO patent grants for Wei; Zhengying.The latest application filed is for "method for improving hdp filling defects through sti etching process".

Company Profile
1.3.5
  • Wei; Zhengying - Shanghai CN
  • WEI; Zhengying - Xi'an CN
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method for improving HDP filling defects through STI etching process
Grant 11,342,217 - Wei , et al. May 24, 2
2022-05-24
Method for Improving HDP Filling Defects through STI Etching Process
App 20220148909 - Wei; Zhengying ;   et al.
2022-05-12
Dynamic Slicing Method For Additive Manufacturing Forming With Variable Forming Direction
App 20220100170 - WEI; Zhengying ;   et al.
2022-03-31
Method for Forming Doped Epitaxial Layer of Contact Image Sensor
App 20220069145 - Qiu; Chenchen ;   et al.
2022-03-03
Method and structure for self aligned contact for integrated circuits
Grant 8,507,378 - Liu , et al. August 13, 2
2013-08-13
Method And Structure For Self Aligned Contact For Integrated Circuits
App 20110037130 - Liu; ChiKang ;   et al.
2011-02-17
Method for Forming a Shallow Trench Isolation Structure
App 20080081433 - Koh; Leong Tce ;   et al.
2008-04-03

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