| Patent | Date |
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Scan chain latch design that improves testability of integrated circuits
Grant 10,571,520 - Maliuk , et al. Feb | 2020-02-25 |
Non-destructive analysis to determine use history of processor
Grant 10,552,278 - Jenkins , et al. Fe | 2020-02-04 |
Detection of hardware trojan using light emissions with sacrificial mask
Grant 10,147,175 - Bahgat Shehata , et al. De | 2018-12-04 |
Non-destructive Analysis To Determine Use History Of Processor
App 20180322025 - Jenkins; Keith A. ; et al. | 2018-11-08 |
Non-destructive analysis to determine use history of processor
Grant 10,102,090 - Jenkins , et al. October 16, 2 | 2018-10-16 |
Detection Of Hardware Trojan Using Light Emissions With Sacrificial Mask
App 20180211377 - Bahgat Shehata; Andrea ; et al. | 2018-07-26 |
Integrated Circuit Temperature Determination Using Photon Emission Detection
App 20180100891 - Stellari; Franco ; et al. | 2018-04-12 |
Minimum-spacing circuit design and layout for PICA
Grant 9,930,325 - Ainspan , et al. March 27, 2 | 2018-03-27 |
Non-destructive Analysis To Determine Use History Of Processor
App 20170329685 - Jenkins; Keith A. ; et al. | 2017-11-16 |
Scan Chain Latch Design That Improves Testability Of Integrated Circuits
App 20170242073 - Maliuk; Dzmitry S. ; et al. | 2017-08-24 |
Scan chain latch design that improves testability of integrated circuits
Grant 9,678,152 - Maliuk , et al. June 13, 2 | 2017-06-13 |
Scan Chain Latch Design That Improves Testability Of Integrated Circuits
App 20170097389 - Maliuk; Dzmitry S. ; et al. | 2017-04-06 |
Scan chain latch design that improves testability of integrated circuits
Grant 9,372,231 - Maliuk , et al. June 21, 2 | 2016-06-21 |
Minimum-spacing Circuit Design And Layout For Pica
App 20160150227 - AINSPAN; HERSCHEL A. ; et al. | 2016-05-26 |
Scan Chain Latch Design That Improves Testability Of Integrated Circuits
App 20160116534 - Maliuk; Dzmitry S. ; et al. | 2016-04-28 |
Method and apparatus for probing a wafer
Grant 9,310,429 - Ippolito , et al. April 12, 2 | 2016-04-12 |
Scan chain latch design that improves testability of integrated circuits
Grant 9,261,561 - Maliuk , et al. February 16, 2 | 2016-02-16 |
Scan Chain Latch Design That Improves Testability Of Integrated Circuits
App 20160003902 - Maliuk; Dzmitry S. ; et al. | 2016-01-07 |
Minimum-spacing circuit design and layout for PICA
Grant 9,229,044 - Ainspan , et al. January 5, 2 | 2016-01-05 |
Minimum-spacing circuit design and layout for PICA
Grant 9,081,049 - Ainspan , et al. July 14, 2 | 2015-07-14 |
Scan Chain Latch Design That Improves Testability Of Integrated Circuits
App 20140298128 - Maliuk; Dzmitry ; et al. | 2014-10-02 |
Minimum-spacing Circuit Design And Layout For Pica
App 20140176183 - Ainspan; Herschel A. ; et al. | 2014-06-26 |
Minimum-spacing Circuit Design And Layout For Pica
App 20130280828 - AINSPAN; HERSCHEL A. ; et al. | 2013-10-24 |
Minimum-spacing Circuit Design And Layout For Pica
App 20130278285 - AINSPAN; HERSCHEL A. ; et al. | 2013-10-24 |
Method And Apparatus For Probing A Wafer
App 20120217974 - Ippolito; Stephen Bradley ; et al. | 2012-08-30 |
Method and apparatus for probing a wafer
Grant 8,248,097 - Ippolito , et al. August 21, 2 | 2012-08-21 |
Constructing variability maps by correlating off-state leakage emission images to layout information
Grant 8,131,056 - Polonsky , et al. March 6, 2 | 2012-03-06 |
Method of virtualization and OS-level thermal management and multithreaded processor with virtualization and OS-level thermal management
Grant 7,886,172 - Bose , et al. February 8, 2 | 2011-02-08 |
Method and Apparatus for Probing a Wafer
App 20100253379 - Ippolito; Stephen Bradley ; et al. | 2010-10-07 |
Method and apparatus for diagnosing broken scan chain based on leakage light emission
Grant 7,788,058 - Song , et al. August 31, 2 | 2010-08-31 |
Techniques for distributing power in electronic circuits and computer systems
Grant 7,698,114 - Hamann , et al. April 13, 2 | 2010-04-13 |
Constructing Variability Maps by Correlating Off-State Leakage Emission Images to Layout Information
App 20100080445 - Polonsky; Stanislav ; et al. | 2010-04-01 |
Equivalent Gate Count Yield Estimation For Integrated Circuit Devices
App 20090112352 - Barnett; Thomas S. ; et al. | 2009-04-30 |
Method Of Virtualization And Os-level Thermal Management And Multithreaded Processor With Virtualization And Os-level Thermal Management
App 20090064164 - Bose; Pradip ; et al. | 2009-03-05 |
Equivalent gate count yield estimation for integrated circuit devices
Grant 7,477,961 - Barnett , et al. January 13, 2 | 2009-01-13 |
Enhanced signal observability for circuit analysis
Grant 7,446,550 - McDowell , et al. November 4, 2 | 2008-11-04 |
Method and apparatus for diagnosing broken scan chain based on leakage light emission
Grant 7,426,448 - Song , et al. September 16, 2 | 2008-09-16 |
Method And Apparatus For Diagnosing Broken Scan Chain Based On Leakage Light Emission
App 20080208507 - SONG; PEILIN ; et al. | 2008-08-28 |
Enhanced signal observability for circuit analysis
Grant 7,355,419 - McDowell , et al. April 8, 2 | 2008-04-08 |
Enhanced Signal Observability For Circuit Analysis
App 20080079448 - McDowell; Chandler Todd ; et al. | 2008-04-03 |
Method For Improved Equivalent Gate Count Yield Estimation For Integrated Circuit Devices
App 20070265722 - Barnett; Thomas S. ; et al. | 2007-11-15 |
Techniques for distributing power in electronic circuits and computer systems
App 20070098037 - Hamann; Hendrik F. ; et al. | 2007-05-03 |
Method and system for measuring temperature and power distribution of a device
Grant 7,167,806 - Hamann , et al. January 23, 2 | 2007-01-23 |
Method and system for measuring temperature and power distributions of a device in a package
App 20060039114 - Hamann; Hendrik F. ; et al. | 2006-02-23 |
Enhanced signal observability for circuit analysis
App 20060028219 - McDowell; Chandler Todd ; et al. | 2006-02-09 |
Method and apparatus for improved detection of multisynchronous signals title
Grant 6,963,811 - Weger November 8, 2 | 2005-11-08 |
Method And Application Of Pica (picosecond Imaging Circuit Analysis) For High Current Pulsed Phenomena
App 20050218921 - Sanda, Naoko Pia ; et al. | 2005-10-06 |
Method and application of PICA (picosecond imaging circuit analysis) for high current pulsed phenomena
Grant 6,943,578 - Sanda , et al. September 13, 2 | 2005-09-13 |
Method and apparatus for diagnosing broken scan chain based on leakage light emission
App 20050168228 - Song, Peilin ; et al. | 2005-08-04 |
Analysis methods of leakage current luminescence in CMOS circuits
Grant 6,909,295 - Polonsky , et al. June 21, 2 | 2005-06-21 |
Method and apparatus for improved detection of multisynchronous signals title
App 20050071100 - Weger, Alan J. | 2005-03-31 |
Analysis methods of leakage current luminescence in CMOS circuits
App 20050062490 - Polonsky, Stanislav V. ; et al. | 2005-03-24 |
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